Invention Grant
- Patent Title: Device for direct X-ray detection
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Application No.: US15575158Application Date: 2016-05-18
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Publication No.: US10367112B2Publication Date: 2019-07-30
- Inventor: Richard White , Chris Bower
- Applicant: Nokia Technologies Oy
- Applicant Address: FI Espoo
- Assignee: Nokia Technologies Oy
- Current Assignee: Nokia Technologies Oy
- Current Assignee Address: FI Espoo
- Agency: Alston & Bird LLP
- Priority: EP15170737 20150604
- International Application: PCT/FI2016/050329 WO 20160518
- International Announcement: WO2016/193531 WO 20161208
- Main IPC: H01L27/146
- IPC: H01L27/146 ; H01L31/115 ; H01L31/0352

Abstract:
A device for direct X-ray detection (516) comprises a plurality of substantially parallel conductive channels (501) separated from one another by a quantum dot material (510), thereby forming a composite material layer (517). The parallel conductive channels (501) are electrically connected to source and drain electrodes (503 504a) which enable a flow of electrical current through the conductive channels (501). The quantum dot material (510) generates electron hole pairs upon exposure to incident electromagnetic radiation and the thus generated charge results in an electric field which causes a change in electrical current passing through at least one of the conductive channels (501). The change in electrical current is indicative of one or more of the presence and magnitude of the incident electromagnetic radiation. Since the conductive channels (501) are oriented in a direction perpendicular to the plane of the substrate (502), the distances between the conductive channels can be chosen under consideration of the diffusion lengths of the generated charge carriers and independently from the thickness of the composite material layer (517) required for X-ray radiation.
Public/Granted literature
- US20180145204A1 DEVICE FOR DIRECT X-RAY DETECTION Public/Granted day:2018-05-24
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