Invention Grant
- Patent Title: Reliability enhancement methods for physically unclonable function bitstring generation
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Application No.: US15534116Application Date: 2015-12-15
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Publication No.: US10366253B2Publication Date: 2019-07-30
- Inventor: James Plusquellic
- Applicant: STC.UNM
- Applicant Address: US NM Albuquerque
- Assignee: STC.UNM
- Current Assignee: STC.UNM
- Current Assignee Address: US NM Albuquerque
- Agency: Valauskas Corder LLC
- International Application: PCT/US2015/065909 WO 20151215
- International Announcement: WO2016/100402 WO 20160623
- Main IPC: G06F21/73
- IPC: G06F21/73 ; G06F21/70 ; G06F21/60 ; G06F21/71 ; G09C1/00 ; H04L9/32 ; G06F17/18

Abstract:
A Hardware-Embedded Delay Physical Unclonable Function (“HELP PUF”) leverages entropy by monitoring path stability and measuring path delays from core logic macros. Reliability and security enhancing techniques for the HELP PUF reduce bit flip errors during regeneration of the bitstring across environmental variations and improve cryptographic strength along with the corresponding difficulty of carrying out model building attacks. A voltage-based enrollment process screens unstable paths on normally synthesized (glitchy) functional units and reduces bit flip errors by carrying out enrollment at multiple supply voltages controlled using on-chip voltage regulators.
Public/Granted literature
- US20170364709A1 RELIABILITY ENHANCEMENT METHODS FOR PHYSICALLY UNCLONABLE FUNCTION BITSTRING GENERATION Public/Granted day:2017-12-21
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