Invention Grant
- Patent Title: Formation of isolation layers using a dry-wet-dry oxidation technique
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Application No.: US15859447Application Date: 2017-12-30
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Publication No.: US10304721B1Publication Date: 2019-05-28
- Inventor: Bradley David Sucher , Neil L. Gardner , Binghua Hu
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Andrew R. Ralston; Charles A. Brill; Frank D. Cimino
- Main IPC: H01L21/762
- IPC: H01L21/762 ; H01L21/02 ; H01L21/306 ; H01L21/8234

Abstract:
In some examples, a method includes etching a substrate to form a trench, wherein the trench includes sidewalls. The method further includes forming a first isolation region in the trench by growing a first layer of a first thickness on the sidewalls using a dry oxidation technique and depositing a second layer to fill a portion of the trench, the second layer contacting the first layer. The method further includes etching third and fourth layers atop the substrate to expose a first portion of the substrate. The method further includes growing a second isolation region in the substrate through the first portion by using a dry-wet-dry oxidation technique.
Information query
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