- Patent Title: Electronic device and method for measuring biometric information
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Application No.: US15044442Application Date: 2016-02-16
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Publication No.: US10299690B2Publication Date: 2019-05-28
- Inventor: Ah-Young Choi , Young-Hyun Kim , Seong-Wook Jo , Jin-Hong Min
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Jefferson IP Law, LLP
- Priority: KR10-2015-0023713 20150216
- Main IPC: A61B5/0408
- IPC: A61B5/0408 ; A61B5/00 ; A61B5/024 ; A61B5/0478 ; A61B5/0496 ; A61B5/0488 ; A61B5/0492 ; A61B5/01 ; A61B5/021 ; A61B5/145 ; A61B5/16

Abstract:
An electronic device for measuring biometric information is provided. The electronic device includes a sensor unit configured to detect an attitude of the electronic device, a biometric information measurement unit configured to detect biometric information on an examinee through a plurality of electrodes formed on at least one surface of the electronic device, a switch unit including a plurality of switches electrically connected to the plurality of electrodes and a controller configured to recognize an array of the plurality of electrodes based on the detected attitude of the electronic device and control the switch unit such that the recognized electrode array corresponds to a preset electrode array.
Public/Granted literature
- US20160235341A1 ELECTRONIC DEVICE AND METHOD FOR MEASURING BIOMETRIC INFORMATION Public/Granted day:2016-08-18
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