- 专利标题: Ultrasonic probe and manufacturing method thereof
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申请号: US14694489申请日: 2015-04-23
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公开(公告)号: US10292680B2公开(公告)日: 2019-05-21
- 发明人: Youngil Kim , Jong Keun Song , Baehyung Kim , Yongrae Roh , Eunsung Lee , Kyungil Cho , Minseog Choi
- 申请人: SAMSUNG ELECTRONICS CO., LTD. , Kyungpook National University Industry-Academic Cooperation Foundation
- 申请人地址: KR Suwon-si KR Daegu
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.,KYUNGPOOK NATIONAL UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.,KYUNGPOOK NATIONAL UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
- 当前专利权人地址: KR Suwon-si KR Daegu
- 代理机构: Sughrue Mion, PLLC
- 优先权: KR10-2014-0048771 20140423
- 主分类号: A61B8/00
- IPC分类号: A61B8/00 ; B06B1/02 ; B06B1/06 ; B06B1/08 ; G01S15/89
摘要:
An ultrasonic probe includes a capacitive micromachined ultrasonic transducer (cMUT) array configured to generate ultrasonic waves, an integrated circuit to which the cMUT array is bonded, and a flexible printed circuit board having one end connected to the integrated circuit to output signals to the integrated circuit, the integrated circuit including pads provided on the integrated circuit and an anisotropic conductive film (ACF) provided on the pads, and the one end of the flexible printed circuit board being connected to the ACF to thereby connect the flexible printed circuit board to the integrated circuit.
公开/授权文献
- US20150305713A1 ULTRASONIC PROBE AND MANUFACTURING METHOD THEREOF 公开/授权日:2015-10-29
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