A scan driver includes a plurality of stages, each outputting a scan signal in response to a scan start pulse and clock signals. Each stage includes a first input circuit applying a high gate voltage to a first node in response to the scan start pulse or the scan signal from a previous stage, a second input circuit applying a first clock signal to a second node based on the first node's voltage, a first output circuit outputting a second clock signal as the scan signal in response to the first node's voltage, a second output circuit outputting a low gate voltage as the scan signal in response to the second node's voltage, and a leakage circuit coupled to the high gate voltage and providing a current from the high gate voltage to the second node in response to the voltage of the second node having a high level.