- 专利标题: Charge loss failure mitigation
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申请号: US15856132申请日: 2017-12-28
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公开(公告)号: US10242747B1公开(公告)日: 2019-03-26
- 发明人: Vipul Patel
- 申请人: MICRON TECHNOLOGY, INC.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Dicke, Billig & Czaja, PLLC
- 主分类号: G11C16/26
- IPC分类号: G11C16/26 ; G11C16/10 ; G11C16/30 ; G11C16/04
摘要:
Methods of operating a memory include reading a particular grouping of memory cells using a read voltage having a particular voltage level, determining a number of memory cells of a subset of memory cells of the particular grouping of memory cells having a particular data state, and, if the number of memory cells of the subset of memory cells having the particular data state is less than a particular threshold, adjusting a voltage level of the read voltage in response to the number of memory cells of the subset of memory cells having the particular data state and reading the particular grouping of memory cells using the read voltage having the adjusted voltage level.
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