- 专利标题: Apparatus and method for resonance magneto-optical defect center material pulsed mode referencing
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申请号: US15468289申请日: 2017-03-24
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公开(公告)号: US10228429B2公开(公告)日: 2019-03-12
- 发明人: Gregory Scott Bruce , Arul Manickam , Peter G. Kaup
- 申请人: Lockheed Martin Corporation
- 申请人地址: US MD Bethesda
- 专利权人: LOCKHEED MARTIN CORPORATION
- 当前专利权人: LOCKHEED MARTIN CORPORATION
- 当前专利权人地址: US MD Bethesda
- 代理机构: Foley & Lardner LLP
- 主分类号: G01R33/26
- IPC分类号: G01R33/26 ; G01R33/032
摘要:
The present disclosure relates to apparatuses and methods for stimulating a magneto-optical defect material with defect centers in a magnetic detection system using a stimulation process to significantly increase magnetic sensitivity of the detection system. The system utilizes a modified Ramsey pulse sequence pair or a shifted magnetometry adapted cancellation (SMAC) pair to detect and measure the magnetic field acting on the system resulting in mitigation of low-frequency noise sources to provide improved sensor sensitivity. For a SMAC pair measurement, two different values of tau are used as well as two different values of the microwave pulse width.
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