- 专利标题: Plasma processing apparatus and plasma processing method
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申请号: US14576424申请日: 2014-12-19
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公开(公告)号: US10211031B2公开(公告)日: 2019-02-19
- 发明人: Chishio Koshimizu , Jun Yamawaku
- 申请人: TOKYO ELECTRON LIMITED
- 申请人地址: JP Tokyo
- 专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人地址: JP Tokyo
- 代理机构: Rothwell, Figg, Ernst & Manbeck, P.C.
- 优先权: JP2013-263996 20131220
- 主分类号: H01J37/32
- IPC分类号: H01J37/32
摘要:
Disclosed is a plasma processing method for generating plasma between an upper electrode connected with a VF power supply and a susceptor disposed to face the upper electrode to perform a plasma processing on a wafer by the plasma. The plasma processing method includes: providing an auxiliary circuit configured to reduce a difference between a reflection minimum frequency of a first route where a high frequency current generated from the VF power supply flows before ignition of the plasma and a reflection minimum frequency of a second route where the high frequency current generated from the VF power supply flows after the ignition of the plasma; igniting the plasma; and maintaining the plasma.
公开/授权文献
- US20150179407A1 PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD 公开/授权日:2015-06-25
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