- 专利标题: Construction of integrated circuitry and a method of forming an elevationally-extending conductor laterally between a pair of structures
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申请号: US15489311申请日: 2017-04-17
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公开(公告)号: US10157841B2公开(公告)日: 2018-12-18
- 发明人: Silvia Borsari
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Wells St. John P.S.
- 主分类号: H01L23/552
- IPC分类号: H01L23/552 ; H01L27/105 ; H01L23/528 ; H01L23/522 ; H01L21/02 ; H01L27/108
摘要:
A method includes forming insulative material along the opposing sides of a conductive via and a conductive line in a vertical cross-section comprising forming a laterally-inner-insulator material comprising silicon, oxygen, and carbon laterally-outward of the opposing sides of the conductive via and the conductive line in the vertical cross-section. A laterally-intervening-insulator material comprising silicon and oxygen is formed laterally-outward of opposing sides of the laterally-inner-insulator material in the vertical cross-section. The laterally-intervening-insulator material comprises less carbon, if any, than the laterally-inner-insulator material. A laterally-outer-insulator material comprising silicon, oxygen, and carbon is formed laterally-outward of opposing sides of the laterally-intervening-insulator material in the vertical cross-section. The laterally-outer-insulator material comprises more carbon than the laterally-inner-insulator material. Elevationally-extending-conductor material is formed laterally between and along the insulative material in the vertical cross-section. Additional method aspects, including structure independent of method of fabrication, are disclosed.
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