- 专利标题: Method for manufacturing oxide
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申请号: US15592654申请日: 2017-05-11
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公开(公告)号: US10157738B2公开(公告)日: 2018-12-18
- 发明人: Shunpei Yamazaki
- 申请人: Semiconductor Energy Laboratory Co., Ltd.
- 申请人地址: JP Kanagawa-ken
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP Kanagawa-ken
- 代理机构: Robinson Intellectual Property Law Office
- 代理商 Eric J. Robinson
- 优先权: JP2015-018610 20150202
- 主分类号: H01L21/02
- IPC分类号: H01L21/02 ; H01L29/24 ; H01L29/04 ; C23C14/08 ; C23C14/34 ; H01L27/06 ; H01L27/092 ; H01L29/66 ; H01L29/786 ; H01L27/108 ; H01L27/1156 ; H01L21/8258 ; H01L27/105 ; H01L27/12 ; H01L27/146
摘要:
Provided is a method for manufacturing an oxide with a novel crystal structure, an oxide with high crystallinity, or an oxide with low impurity concentration by a sputtering method. The method comprises the steps of cleaving pellets and aggregates of atoms from a sputtering target containing indium, an element M (aluminum, gallium, yttrium, or tin), and zinc, depositing the pellets and the aggregates of atoms on a substrate, and then filling a gap between the pellets by the aggregates of atoms with lateral growths.
公开/授权文献
- US20170250077A1 OXIDE AND MANUFACTURING METHOD THEREOF 公开/授权日:2017-08-31
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