A method of correcting charge values acquired from a capacitive fingerprint sensor, comprising acquiring a list of one or more defective capacitive sensor elements and for defective capacitive sensor element in the list, selecting its position as a first position and: performing a first operation by placing a first filter window about the first position and computing a replacement value for the first position from charge values within the first filter window, but forgoing computing a replacement value for the first position in case a first threshold number of defective capacitive sensor elements located within the first filter window is exceeded; in case the first operation forgo computing a replacement value for the first position, performing a second operation by placing a second filter window about the first position and computing a replacement value for the first position from charge values within the second filter window, but forgoing computing a replacement value for the first position in case a second threshold number of defective capacitive sensor elements located within the second filter window is exceeded; wherein the second filter window has a wider expanse than the first filter window.