- 专利标题: Exposure apparatus, exposure method, and method for producing device
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申请号: US15094678申请日: 2016-04-08
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公开(公告)号: US10048602B2公开(公告)日: 2018-08-14
- 发明人: Naoyuki Kobayashi , Soichi Owa , Shigeru Hirukawa , Yasuhiro Omura
- 申请人: NIKON CORPORATION
- 申请人地址: JP Tokyo
- 专利权人: NIKON CORPORATION
- 当前专利权人: NIKON CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Oliff PLC
- 优先权: JP2004-028092 20040204
- 主分类号: G03B27/52
- IPC分类号: G03B27/52 ; G03B27/42 ; G03F7/20
摘要:
An exposure apparatus exposes a substrate by irradiating exposure light on the substrate through liquid. The exposure apparatus has a substrate holder for holding the substrate, a substrate stage capable of moving the substrate held by the substrate holder, and a temperature adjusting system for adjusting the temperature of the substrate holder. The temperature of the substrate is controlled so that there is no difference in temperature between the substrate and the liquid, thereby preventing a reduction in exposure accuracy resulting from variation in temperature of the liquid.
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