The invention provides a probe card, test equipment comprising the probe card, and a test method. The probe card comprises a PCB board, a hollow needle and a probe; the hollow needle and the probe arerespectively connected with the PCB board, and the hollow needle and the probe are adjacently arranged; the hollow needle is used for releasing flame-retardant gas. During testing, the needle tip ofthe hollow needle can be used to spray the flame-retardant gas to form a flame-retardant gas protective atmosphere, so that an ignition phenomenon of a semiconductor chip during the testing can be effectively reduced. The test equipment comprises the probe card, a pipeline and a high-voltage test device, wherein the pressure cavity of the probe card is connected with the pipeline, and the probe card is inserted into the high-voltage test device through an interface. The test equipment is used to prevent the ignition phenomenon during the testing of the semiconductor chip, and the safety of thesemiconductor chip is guaranteed, and the test precision is greatly improved.