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发明公开
CN109959666A 一种阵列基板缺陷判定方法、处理器及判定系统 有权

一种阵列基板缺陷判定方法、处理器及判定系统
摘要：
本发明公开了一种阵列基板缺陷判定方法、处理器及判定系统，该方法包括：实时获取待判别阵列基板当前扫描区域的表面图像数据；对获取到的表面图像数据进行处理，确定阵列基板存在的缺陷与扫描时间的对应关系；根据缺陷与扫描时间的对应关系、预存储的扫描时间与扫描位置的对应关系以及预存储的缺陷类型规则，确定阵列基板中存在缺陷的类型。上述方法可以根据实时获取待判别阵列基板当前扫描区域的表面图像数据，确定阵列基板中存在缺陷的类型，无需工程师进行人为判定，节约了缺陷判定时间，根据判定结果可以及时对缺陷进行处理，避免大量的经济损失。
摘要（英）：

The invention discloses an array substrate defect determination method, a processor and a determination system. The method comprises the steps that the surface image data of a current scanning area ofan array substrate to be discriminated are acquired in real time; the acquired surface image data are processed to determine the correspondence between the defect of an array substrate and the scan time; according to the correspondence between the defect and the scan time, the correspondence between pre-stored scan time and a scan position and a pre-stored defect type rule, the type of the defectin the array substrate is determined. The method can determine the type of the defect in the array substrate according to the acquired surface image data of the current scan area of the array substrate to be discriminated in real time, and does not require an engineer to perform manual determination. The defect determination time is saved. The defect is processed timely according to the determination result to avoid a lot of economic losses.

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