The invention discloses an apparatus for improving inspection fragments and detection omission, and an inspection method. The apparatus is a square shift box, only two adjacent surfaces of the box are provided with baffles, internal side surfaces of the shift box are provided with silicone gaskets, and the bottom is provided with a sponge cushion. The inspection method includes: firstly, the shift box is arranged at a certain inclination angle; then the number of the shift boxes is set according to the shift number of classified detection, the shift boxes are arranged in two rows, and a certain interval is reserved between each two adjacent shift boxes; and finally, a color sample is arranged at the middle position of the two rows of shift boxes. The beneficial effects of the apparatus and the method are that the proportion of fragment generation of cells due to collision in an inspection process is reduced, the comparison with the color sample can be realized at any time in a color sorting process, color change can be avoided, detection omission of a back surface field due to non-standard operation of an inspector is avoided, the inspection speed of the inspector can be effectively controlled, and detection omission due to over-fast inspection speed is reduced.