The invention provides an integrated multi-IGBT-module multi-aging-characteristic measurement device. The device comprises to-be-measured IGBT modules, an aging characteristic measurement mainboard and a driving circuit, wherein the driving circuit is arranged on the aging characteristic measurement mainboard, the to-be-measured IGBT modules are multiple in number, the multiple to-be-measured IGBT modules are arranged in parallel on a measurement work station of the aging characteristic measurement mainboard, and aging characteristic parameters of the to-be-measured IGBT modules are acquired through the aging characteristic measurement mainboard. The device is advantaged in that multiple aging characteristics of the multiple IGBT modules can be rapidly measured under a same constant temperature environment, the measurement time is shortened to a maximum degree, measurement environment consistency is guaranteed, determination is carried out on the basis of the multiple aging characteristics including saturation conduction voltage reduction, transmission characteristic curve, parasitic capacitance and IGBT switch transient waveform, and thereby accuracy of a measurement result is guaranteed.