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发明公开
CN105527252A 一种光学元件反射率测量仪 无效 - 驳回

一种光学元件反射率测量仪
摘要：
本发明提供了一种光学元件反射率测量仪，用于光学元件反射率的测量。本发明的光学元件反射率测量仪采用光电二极管采集光学元件或光学标准片的反射光并转换为电信号，电信号再经过前置放大器和锁相放大器放大后，得到与信号光强度成正比的直流电压信号。该仪器以测量光学标准片反射光所获得的直流电压信号为基准，测量待测元件反射光所获得的直流电压信号与基准比对，获得待测光学元件的反射率。本发明结构简单，易于实现，测量精度高，且能够实现对光学元件反射率的在线测量。
摘要（英）：

The invention provides an optical element reflectivity measurement instrument which is used for measuring the reflectivity of optical elements. The optical element reflectivity measurement instrument disclosed by the invention adopts a photodiode to collect reflecting light of an optical element or an optical standard sheet and transforms the reflecting light into an electric signal; after the electric signal is amplified by a pre-amplifier and a lock-in amplifier, a direct current voltage signal in direct proportion to signal light intensity is obtained. The instrument takes the direct current voltage signal obtained by measuring the reflecting light of the optical standard sheet as the benchmark, through comparing the direct current voltage signal obtained by measuring the reflecting light of the element to be measured with the benchmark, the reflectivity of the optical element to be measured is obtained. The optical element reflectivity measurement instrument disclosed by the invention is simple in structure, easy to realize, high in measurement accuracy, and capable of measuring the reflectivity of optical elements on line.

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