The invention discloses an IC card static test device and a test method. The test device comprises a DA converting circuit, a positive high-voltage power supply, a negative high-voltage power supply, a power change-over switch, a charging/discharging switch, a charging capacitor, a first resistor and a second resistor. The positive voltage output end of the DA converting circuit is connected with the input end used for generating positive high-voltage power for the positive high-voltage power supply. The negative voltage output end is connected with the input end used for generating negative high-voltage power for the negative high-voltage power supply. The output end of the positive high-voltage power supply is connected with the first input end of the power change-over switch. The output end of the negative high-voltage power supply is connected with the second input end of the power change-over switch. The output end of the power change-over switch is connected with the normally-closed input end of the charging/discharging switch through the first resistor. The output end of the charging/discharging switch is connected to the ground via the charging capacitor. The normally-opened input end of the charging/discharging switch is connected with a high-voltage probe via the second resistor. According to the invention, by using the two high-voltage power supplies, output stability and output precision are improved.