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CN104661732B 一体型分离膜结构体的缺陷检测方法、修补方法以及一体型分离膜结构体 有权

一体型分离膜结构体的缺陷检测方法、修补方法以及一体型分离膜结构体
摘要：
提供检测孔单元上形成有分离膜的一体型分离膜结构体缺陷的简易的缺陷检测方法。此外，提供修补具有缺陷孔单元的一体型分离膜结构体的修补方法、经过修补的一体型分离膜结构体。从孔单元(4)外对每个孔单元(4)用气体加压，测定气体渗透孔单元(4)内的渗透量，渗透量多于(所有孔单元的渗透量平均值+A)(其中A为σ～6σ的规定值、σ为标准偏差)的孔单元(4)判断为有缺陷的孔单元。或者，对每个孔单元(4)减压，测定孔单元(4)的真空度，真空度的值比(所有孔单元的真空度平均值+A)低的孔单元(4)判断为有缺陷的孔单元。然后，向一体型分离膜结构体(1)的缺陷孔单元(4)内注入高分子化合物(27)，令其固化，堵住缺陷孔单元(4)。或者，将预成型的高分子化合物(27)插入缺陷孔单元(4)，堵住缺陷孔单元(4)。
摘要（英）：

There is provided a simple defect detection method for detecting defects in a monolithic separation membrane structure in which a separation membrane is formed in the cells. In addition, there are provided a repair method for repairing a monolithic separation membrane structure having a defective cell and a repaired monolithic separation membrane structure. Each cell (4) is pressurized with gas from outside of the cell (4), the amount of permeation of the gas permeated into each cell (4) is measured, and a cell (4) having the amount of permeation greater than "average value of all cells + A" (wherein A is a predetermined value of à to 6Ã, where à is the standard deviation) is considered to be defective. Alternatively, pressure is reduced for each cell (4), the degree of vacuum in each cell (4) is measured, and a cell (4) having the degree of vacuum worse than "average value of all cells + A" is considered to be defective. Then, a polymer compound (27) is poured into the defective cells (4) of the monolithic separation membrane structure (1) and cured so that the defective cells (4) are sealed. Alternatively, the polymer compound (27) formed in advance as the sealing member is inserted into the defective cells (4) to seal the defective cells (4).

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