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CN103718016A 用双能X射线计算机断面显像技术估算岩样的有效原子序数和体积密度的方法 失效 - 权利终止

  • Patent Title: 用双能X射线计算机断面显像技术估算岩样的有效原子序数和体积密度的方法
  • Patent Title (English): Method for estimating effective atomic number and bulk density of rock samples using dual energy x-ray computed tomographic imaging
  • Application No.: CN201280037280.2
    Application Date: 2012-06-20
  • Publication No.: CN103718016A
    Publication Date: 2014-04-09
  • Inventor: N.德治
  • Applicant: 因格瑞恩股份有限公司
  • Applicant Address: 美国德克萨斯州
  • Assignee: 因格瑞恩股份有限公司
  • Current Assignee: 因格瑞恩股份有限公司
  • Current Assignee Address: 美国德克萨斯州
  • Agency: 北京市柳沈律师事务所
  • Agent 吴俊
  • Priority: 61/511,600 2011.07.26 US
  • International Application: PCT/US2012/043213 2012.06.20
  • International Announcement: WO2013/015914 EN 2013.01.31
  • Date entered country: 2014-01-26
  • Main IPC: G01N9/24
  • IPC: G01N9/24 ;  G01N23/087
用双能X射线计算机断面显像技术估算岩样的有效原子序数和体积密度的方法
Abstract:
本发明提供一种用X射线计算机断层显像技术估算岩样或钻井岩心等物体的有效原子序数和体积密度的方法。该方法能有效地补偿CT扫描数据判读中的误差，并能产生与实际体积密度值相比具有较低剩余误差的体积密度值以及与物理观测结果一致的体积密度-有效原子序数趋势。
Abstract(English):

A method for estimating effective atomic number and bulk density of objects, such as rock samples or well cores, using X-ray computed tomographic imaging techniques is provided. The method effectively compensates for errors in the interpretation of CT scan data and produces bulk densities which have lower residual error compared to actual bulk densities and produces bulk density - effective atomic number trends which are consistent with physical observations.

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