The invention discloses a high-frequency integrated circuit alternating current automatic test probe with ultra small spacing. The high-frequency integrated circuit alternating current automatic test probe comprises a plurality of active type elastic sampling upper pieces and a plurality of active type elastic sampling lower pieces, wherein the active type elastic sampling upper pieces are evenly distributed on the upper layer in an array and asymmetrical mode, the active type elastic sampling lower pieces are evenly and correspondingly distributed on the lower layer in an array and asymmetrical mode. The active type elastic sampling upper pieces are provided with insulating parts used for locating the active type elastic sampling upper pieces, and the active type elastic sampling lower pieces are provided with insulating parts used for locating the active type elastic sampling lower pieces. The front portions of the active type elastic sampling upper pieces and the front portions of the active type elastic sampling lower pieces are integrally encapsulated in an arranged plastic package body. Upper layer metal shielding pieces are arranged in the portion, on the upper sides of the active type elastic sampling upper pieces, of the plastic package body, lower layer metal shielding pieces are arranged in the portion, on the lower sides of the active type elastic sampling lower pieces, of the plastic package body, and middle layer metal shielding pieces are arranged in the portion, between the active type elastic sampling upper pieces and the active type elastic sampling lower pieces, of the plastic package body. The metal shielding pieces on each layer are arranged in a pairing mode. According to the high-frequency integrated circuit alternating current automatic test probe with the ultra small spacing, the sampling pieces are arranged in a top-and-bottom dual-piece mode, and therefore testing reliability is improved.