The invention provides a static random access memory ageing and screening method and a chip ageing and screening method. The static random access memory (SRAM) ageing and screening method comprises the following steps: forming a current loop consisting of a storage unit, a related one-bit line and a complementary bit line through related control signals of the storage unit of a static random access memory, and carrying out ageing and screening operations for metal contacts of the storage unit through the current. Therefore, the method can be used for eliminating products with poor metal contacts.