-
公开(公告)号：US20240219420A1
公开(公告)日：2024-07-04
申请号：US18404780
申请日：2024-01-04
Applicant: Brown University
Inventor： Daniel MITTLEMAN , Angela PIZZUTO
Abstract: A method for scanning near-field optical microscopy comprises illuminating an apertureless atomic force microscopy (AFM) probe with electromagnetic energy having a frequency in the Terahertz range, where the sample under observation includes a dielectric layer having a thickness greater than the radius of the tip of the AFM probe. A system for scanning near-field optical microscopy comprises a collimated light source for emitting collimated light, a photoconductive antenna for converting collimated light into electromagnetic energy having a frequency in the Terahertz range, an AFM probe, a sample comprising a dielectric layer, the dielectric layer having a thickness greater than the radius of the probe tip; and a detector configured to detect energy that has interacted with the sample.
-
公开(公告)号：US11808783B2
公开(公告)日：2023-11-07
申请号：US17507104
申请日：2021-10-21
Applicant: CORNELL UNIVERSITY
Inventor： John Marohn , Sarah Nathan , Ryan Dwyer
Abstract: Atomic force microscopy apparatus and method that enable observing charge generation transients with nanometer spatial resolution and nanosecond to picosecond time resolution, the timescale relevant for studying photo-generated charges in the world's highest efficiency photovoltaic films. The AFM apparatus includes an AFM, a light source for illumination of a sample operatively coupled to the AFM, a voltage source operatively coupled to the AFM, and a control circuitry operatively coupled to the light source and the voltage source. The AFM apparatus improves the time resolution and enables rapid acquisition of photocapacitance transients in a wide array of solar-energy-harvesting materials.
-
公开(公告)号：US11448664B2
公开(公告)日：2022-09-20
申请号：US17069302
申请日：2020-10-13
Applicant: Bruker Nano, Inc.
Inventor： Jeffrey Wong
IPC: G01Q60/30 , G01Q70/10 , G01Q70/16 , G01Q60/38 , C23C16/34 , C23C16/56 , C23C16/44 , C23C16/02 , G01Q60/36
Abstract: A large radius probe for a surface analysis instrument such as an atomic force microscope (AFM). The probe is microfabricated to have a tip with a hemispherical distal end or apex. The radius of the apex is the range of about a micron making the probes particularly useful for nanoindentation analyses. The processes of the preferred embodiments allow such large radius probes to be batch fabricated to facilitate cost and robustness.
-
公开(公告)号：US20210318353A1
公开(公告)日：2021-10-14
申请号：US17261494
申请日：2019-07-24
Inventor： Roelof Willem HERFST , Anton Adriaan BIJNAGTE , Jan Jacobus Benjamin BIEMOND , Klara MATUROVA
Abstract: The invention is directed at a method of performing scanning probe microscopy on a substrate surface using a scanning probe microscopy system. A probe tip and substrate surface are moved relative to each other in one or more directions parallel to the scanning plane to position the probe tip to a scanning position on the substrate surface with the probe tip; a displacement is measured by an encoder of said probe tip in said one or more directions; and a fiducial pattern is provided fixed relative to the substrate surface, said fiducial pattern having a scannable structure that is scannable by said probe tip and said structure forming a grid of fiducial marks in said one or more dimensions; said grid dimensioned to allow for measuring placement deviations of the probe tip relative to the probe head by identifying one or more fiducial marks in the fiducial pattern.
-
公开(公告)号：US20210125809A1
公开(公告)日：2021-04-29
申请号：US17252837
申请日：2018-06-29
Inventor： Yu SUN , Jun CHEN , Ko Lun CHEN , Tiancong WANG
Abstract: A method discloses topography information extracted from scanning electron microscope (SEM) images to determine the atomic force microscope (AFM) image scanning speed at each sampling point or in each region on a sample. The method includes the processing of SEM images to extract possible topography features and create a feature metric map (step 1), the conversion of the feature metric map into AFM scan speed map (step 2), and performing AFM scan according to the scan speed map (step 3). The method enables AFM scan with higher scan speeds in areas with less topography feature, and lower scan speeds in areas that are rich in topography features.
-
公开(公告)号：US10254268B2
公开(公告)日：2019-04-09
申请号：US15465344
申请日：2017-03-21
Inventor： Jinsung Park , Woong Kim , Joohyung Park , Seongjae Jo , Minwoo Kim , Gyudo Lee
IPC: G01N33/20 , G01N1/28 , B82Y30/00 , B82Y35/00 , C01G7/00 , G01Q60/24 , G01Q60/28 , G01N21/78 , G01Q60/30 , G01N15/00 , B82Y15/00
Abstract: Disclosed is a method for detecting toxic metal ions in a sample. The method includes: a) preparing a solution of organic acid-bound gold nanoparticles; b) adding a sample containing toxic metal ions to the solution prepared in a) to allow the gold nanoparticles to aggregate; c) dropping the reaction solution obtained in b) onto a silicon substrate and drying the reaction solution such that the gold nanoparticle aggregates are immobilized on the silicon substrate; and d) analyzing the characteristics of the gold nanoparticles immobilized on the silicon substrate. The method enables the detection of even a trace amount of toxic metal ions in a sample with high sensitivity. Therefore, the method can be applied to the management of water quality in food service providers and hospitals, the measurement of contaminants in water supply and drainage systems, and the management of industrial wastewater. Furthermore, the method is expected to be widely applicable to water purifiers and the food and beverage industry in the future.
-
公开(公告)号：US20190094268A1
公开(公告)日：2019-03-28
申请号：US16079817
申请日：2017-02-24
Applicant: ADVANCED MEASUREMENT TECHNOLOGY INC
Inventor： Charles R. Sides
IPC: G01Q60/30
Abstract: A scanning probe used to measure and determine the features of an electrically conductive surface and which can be used to determine present corrosion state of a bare or coated metal and monitor corrosion progression under coatings that previously had to be removed to assess the present corrosion state and corrosion progression of the underlying metal surface.
-
公开(公告)号：US10215686B2
公开(公告)日：2019-02-26
申请号：US14905048
申请日：2013-07-22
Applicant: Hitachi, Ltd.
Inventor： Kyoko Hombo , Kenya Ohashi , Masahiro Itoh , Mitsuharu Ikeda , Takeshi Fukuma , Naritaka Kobayashi , Shoichiro Ogata
Abstract: The objective of the present invention is to provide a corrosion resistance evaluation method and evaluation device that make it possible to estimate crevice corrosion depth and pitting depth in a short period of time. A corrosion resistance evaluation method according to the present invention is characterized in that the surface potential of a metal under evaluation is measured in a state in which the metal is immersed in a usage-environment liquid, the surface potential distribution of the metal is determined, the surface potential differences in the microstructure of the metal are calculated on the basis of the surface potential distribution, and the corrosion rate of crevice corrosion and corrosion rate of pitting are predicted using the maximum surface potential difference from among the calculated surface potential differences as an evaluation index for corrosion evaluation.
-
公开(公告)号：US10060862B2
公开(公告)日：2018-08-28
申请号：US15479657
申请日：2017-04-05
Applicant: Yongtao Cui , Yue Ma , Zhixun Shen
Inventor： Yongtao Cui , Yue Ma , Zhixun Shen
CPC classification number: G01N22/00 , G01N27/02 , G01Q10/045 , G01Q20/04 , G01Q60/30
Abstract: A microwave impedance microscope including a tuning fork having a high-aspect ratio etched metal tip electrode extending transversely to one tine of the fork and having a high aspect ratio to thereby reduce parasitic capacitance. The metal tip may be electrochemically etched from a wire, then bonded to the tine. The fork is slightly inclined from the surface of the sample and the tip electrode projects transversely to the fork. A microwave signal is impressed on the tip. Microwave circuitry receives microwave signals reflected from the sample back into the tip and demodulates the reflected signal according to the impressed signal. Further circuitry further demodulates the reflected signal according to the lower-frequency signal causing the fork to oscillate at its mechanically resonant frequency. A multi-wavelength matching circuit interposed between the microwave circuitry and the probe includes a coaxial cable of length half a fundamental microwave wavelength.
-
公开(公告)号：US09810713B2
公开(公告)日：2017-11-07
申请号：US15057963
申请日：2016-03-01
Applicant: Bruker Nano, Inc.
Inventor： Jian Shi , Yan Hu , Shuiqing Hu , Ji Ma , Chanmin Su
CPC classification number: G01Q20/00 , B82Y35/00 , G01Q10/065 , G01Q20/02 , G01Q60/24 , G01Q60/30 , G01Q60/32 , G01Q60/34
Abstract: Methods and apparatuses are provided for automatically controlling and stabilizing aspects of a scanning probe microscope (SPM), such as an atomic force microscope (AFM), using Peak Force Tapping (PFT) Mode. In an embodiment, a controller automatically controls periodic motion of a probe relative to a sample in response to a substantially instantaneous force determined, and automatically controls a gain in a feedback loop. A gain control circuit automatically tunes a gain based on separation distances between a probe and a sample to facilitate stability. Accordingly, instability onset is quickly and accurately determined during scanning, thereby eliminating the need of expert user tuning of gains during operation.
