FOUNTAIN SOLUTION THICKNESS MEASUREMENT SYSTEM AND METHOD USING ELLIPSOMETRY

    公开(公告)号:US20220412878A1

    公开(公告)日:2022-12-29

    申请号:US17355692

    申请日:2021-06-23

    Abstract: An optical light reflectance measurement system above an imaging member surface measures fountain solution surface light reflectance interference on reflective substrate portions of the imaging member surface in real-time during a printing operation. The measured light reflectance interference corresponds to a thickness of the fountain solution layer and may be used in a feedback loop to actively control fountain solution layer thickness by adjusting the volumetric feed rate of fountain solution added onto the imaging member surface during a printing operation to reach a desired uniform thickness for the printing. This fountain solution monitoring system may be fully automated.

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