APPARATUS FOR MEASURING MAGNETIC FIELD OF MICROWAVE-ASSISTED HEAD
    1.
    发明申请
    APPARATUS FOR MEASURING MAGNETIC FIELD OF MICROWAVE-ASSISTED HEAD 失效
    用于测量微波辅助磁头的磁场的装置

    公开(公告)号:US20130301162A1

    公开(公告)日:2013-11-14

    申请号:US13726767

    申请日:2012-12-26

    CPC classification number: G11B5/455 G01R33/098 G01R33/1284

    Abstract: A measuring circuit system in a magnetic field measuring apparatus of the invention has an amplifier and a band-pass filter connected in sequence on an output terminal side of the TMR element, the band-pass filter is a narrow-range band-pass filter such that a peak pass frequency of the filter that is a center is a basic frequency selected from a range of 10 to 40 GHz and a band width centered around the basic frequency is a narrow range of ±0.5 to ±4 GHz; and with the measuring circuit system, an S/N ratio (SNR) of 3 dB or greater is obtained, the SNR being defined by a ratio of an amplitude S of a high-frequency generated signal induced by the TMR element to a total noise N that is a sum of a head noise generated by the TMR element and a circuit noise generated by the amplifier. With such a configuration, an in-plane high-frequency magnetic field generated by a microwave-assisted magnetic head is reliably and precisely measured.

    Abstract translation: 本发明的磁场测量装置中的测量电路系统具有在TMR元件的输出端侧依次连接的放大器和带通滤波器,带通滤波器是窄范围带通滤波器, 作为中心的滤波器的峰值通过频率是从10〜40GHz的范围选择的基本频率,以基本频率为中心的频带宽度为±0.5〜±4GHz的窄范围; 并且利用测量电路系统,获得3dB或更大的S / N比(SNR),SNR由TMR元件引起的高频产生信号的振幅S与总噪声的比率定义 N是由TMR元件产生的头噪声和由放大器产生的电路噪声之和。 通过这样的结构,可以可靠且精确地测量由微波辅助磁头产生的面内高频磁场。

Patent Agency Ranking