Bi-polar write scheme
    1.
    发明授权

    公开(公告)号:US10991410B2

    公开(公告)日:2021-04-27

    申请号:US16598568

    申请日:2019-10-10

    Abstract: A method of writing data into a memory device is disclosed. The method comprises utilizing a pipeline to process write operations of a first plurality of data words addressed to a memory bank and writing a second plurality of data words and associated memory addresses into an error buffer. The method also comprises monitoring a first counter value which tracks a number of write 1 errors and a second counter value which tracks a number of write 0 errors in the memory bank. Further, the method comprises determining if the first counter value and the second counter value have exceeded a predetermined threshold. Responsive to a determination that the first counter value has exceeded the predetermined threshold increasing a write 1 voltage of the memory bank, and, further, responsive to a determination that the second counter value has exceeded the predetermined threshold increasing a write 0 voltage of the memory bank.

    MRAM ARRAY HAVING REFERENCE CELL STRUCTURE AND CIRCUITRY THAT REINFORCES REFERENCE STATES BY INDUCED MAGNETIC FIELD

    公开(公告)号:US20200302983A1

    公开(公告)日:2020-09-24

    申请号:US16362329

    申请日:2019-03-22

    Abstract: A magnetic memory device that includes magnetic read elements and magnetic reference cells. The magnetic reference cells include magnetic tunnel junction elements having the same construction as the magnetic read elements. The reference cells produce a reference signal that can be compared with a read signal from the magnetic read element to determine whether the read element is in a high or low resistance state. During creation of the reference signal, the current passes in such a way so that reference cells are forced to be in the right state while causing no disturbance to the reference cell. The reference cell includes magnetic tunnel junction elements and also includes circuitry configured to produce a magnetic field that biases the magnetic tunnel junction elements of the reference cell into a desired magnetic state to ensure that the desired magnetic state of the reference cell magnetic tunnel junction elements is maintained.

    High retention multi-level-series magnetic random-access memory

    公开(公告)号:US11094359B2

    公开(公告)日:2021-08-17

    申请号:US16256766

    申请日:2019-01-24

    Abstract: A magnetic memory pillar structure having a plurality of magnetic memory elements connected in series, wherein switching of individual memory elements in the pillar structure can be accomplished based on differing switching current values of the magnetic memory elements. Each of the plurality of memory elements advantageously have similar retention values in spite of the different switching current values (latency values) as a result of a precessional spin current injection structure provided in the memory element or memory elements having the lower switching current value.

    Multi-bit cell read-out techniques

    公开(公告)号:US10559338B2

    公开(公告)日:2020-02-11

    申请号:US16028412

    申请日:2018-07-06

    Abstract: Techniques for reading a Multi-Bit Cell (MBC) can include sensing a state parameter value, such as source line voltage, and applying a successive one of N programming parameter values, such as successive programming currents, between instances of sensing the state parameter values. The N successive programming parameter values can be selected to program the state of a corresponding one of N cell elements of the MBC to a respective state parameter value. Successive ones of the sensed state parameter values can be compared to determine N state change results, which can be used to determine the read state of the MBC.

    HIGH RETENTION MULTI-LEVEL-SERIES MAGNETIC RANDOM-ACCESS MEMORY

    公开(公告)号:US20200243124A1

    公开(公告)日:2020-07-30

    申请号:US16256766

    申请日:2019-01-24

    Abstract: A magnetic memory pillar structure having a plurality of magnetic memory elements connected in series, wherein switching of individual memory elements in the pillar structure can be accomplished based on differing switching current values of the magnetic memory elements. Each of the plurality of memory elements advantageously have similar retention values in spite of the different switching current values (latency values) as a result of a precessional spin current injection structure provided in the memory element or memory elements having the lower switching current value.

    Multi-Bit Cell Read-Out Techniques
    9.
    发明申请

    公开(公告)号:US20200013445A1

    公开(公告)日:2020-01-09

    申请号:US16028412

    申请日:2018-07-06

    Abstract: Techniques for reading a Multi-Bit Cell (MBC) can include sensing a state parameter value, such as source line voltage, and applying a successive one of N programming parameter values, such as successive programming currents, between instances of sensing the state parameter values. The N successive programming parameter values can be selected to program the state of a corresponding one of N cell elements of the MBC to a respective state parameter value. Successive ones of the sensed state parameter values can be compared to determine N state change results, which can be used to determine the read state of the MBC.

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