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1.
公开(公告)号:US11798814B2
公开(公告)日:2023-10-24
申请号:US17827966
申请日:2022-05-30
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Junghoon Kang
IPC: H01L21/48 , H01L23/538 , H01L25/18 , H01L25/00 , H01L21/683 , H01L23/498
CPC classification number: H01L21/4857 , H01L21/4853 , H01L21/6835 , H01L23/5383 , H01L25/18 , H01L25/50 , H01L23/49811 , H01L2221/68381
Abstract: A semiconductor package includes an interposer having a separation layer on a rear surface of which a plurality of first recesses is arranged. A plurality of wiring structures is stacked on the separation layer alternately with a plurality of insulation interlayers. A plurality of semiconductor devices is arranged, side by side, on the interposer side and connected to a plurality of the wiring structures. A plurality of contact terminals on the rear surface of the separation layer is connected to the plurality of the wiring structures through the separation layer. A flatness deterioration of the interposer is minimized and the contact surface between the interposer and under fill resin is enlarged.
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公开(公告)号:US20250022859A1
公开(公告)日:2025-01-16
申请号:US18427622
申请日:2024-01-30
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Junghoon Kang
IPC: H01L25/16 , H01L21/48 , H01L23/00 , H01L23/13 , H01L23/31 , H01L23/498 , H01L23/538 , H01L23/58 , H01L21/56
Abstract: A semiconductor package includes a wiring substrate and a first semiconductor chip disposed on the wiring substrate. The wiring substrate includes a first core portion including glass and having a cavity that vertically penetrates the first core portion, first core vias that each vertically penetrate the first core portion, a passive device in the cavity of the first core portion, a buried material on the first core portion and the first core vias and filling the cavity and covering a top surface and outer lateral surfaces of the first core portion, and an upper buildup portion disposed on the buried material. The upper buildup portion includes a first dielectric pattern, and a first wiring pattern that penetrates the first dielectric pattern and the buried material and is coupled to the first core vias.
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3.
公开(公告)号:US20220293432A1
公开(公告)日:2022-09-15
申请号:US17827966
申请日:2022-05-30
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Junghoon Kang
IPC: H01L21/48 , H01L23/538 , H01L25/18 , H01L25/00 , H01L21/683
Abstract: A semiconductor package includes an interposer having a separation layer on a rear surface of which a plurality of first recesses is arranged. A plurality of wiring structures is stacked on the separation layer alternately with a plurality of insulation interlayers. A plurality of semiconductor devices is arranged, side by side, on the interposer side and connected to a plurality of the wiring structures. A plurality of contact terminals on the rear surface of the separation layer is connected to the plurality of the wiring structures through the separation layer. A flatness deterioration of the interposer is minimized and the contact surface between the interposer and under fill resin is enlarged.
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公开(公告)号:US12100668B2
公开(公告)日:2024-09-24
申请号:US18496372
申请日:2023-10-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Junghoon Kang
IPC: H01L23/31 , H01L23/00 , H01L23/538 , H01L23/544 , H01L25/065
CPC classification number: H01L23/544 , H01L23/3121 , H01L23/5384 , H01L23/5386 , H01L24/16 , H01L25/0657 , H01L2224/16225 , H01L2225/06517
Abstract: A semiconductor package includes a first semiconductor chip; an encapsulant covering at least a portion of the first semiconductor chip; insulating layers provided on the encapsulant, each of the insulating layers being transparent or translucent; and wiring layers provided on the encapsulant, the wiring layers being partially covered by the insulating layers, wherein an outermost insulating layer of the insulating layers comprises a first region and a second region, a color of the first region is different from a color of the second region, the second region surrounds the first region, and at least one marking pattern comprising at least one step portion is provided in the first region of the outermost insulating layer.
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公开(公告)号:US20240213174A1
公开(公告)日:2024-06-27
申请号:US18515797
申请日:2023-11-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Junghoon Kang , Unbyoung Kang , Jinsu Kim , Seungwan Shin , Byoungwook Jang
IPC: H01L23/544 , H01L23/00 , H01L23/31 , H01L23/498 , H01L25/065 , H01L25/10
CPC classification number: H01L23/544 , H01L23/3128 , H01L23/49811 , H01L24/16 , H01L24/20 , H01L25/0657 , H01L25/105 , H01L2223/54433 , H01L2224/16225 , H01L2224/21 , H01L2225/06506 , H01L2225/0651 , H01L2225/06562
Abstract: A semiconductor package includes a lower redistribution wiring layer having a first region and a second region adjacent the first region and including first redistribution wirings; a semiconductor chip on the first region of the lower redistribution wiring layer and electrically connected to the first redistribution wirings; a sealing member on a side surface of the semiconductor chip and on the lower redistribution wiring layer; a plurality of vertical conductive structures penetrating the sealing member on the second region of the lower redistribution wiring layer and electrically connected to the first redistribution wirings; a marking pattern on the semiconductor chip; seed layer pads on respective end portions of the vertical conductive structures that are exposed by the sealing member at an upper surface thereof; and an upper redistribution wiring layer on the sealing member and the marking pattern and including second redistribution wirings.
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公开(公告)号:US11837553B2
公开(公告)日:2023-12-05
申请号:US17405696
申请日:2021-08-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Junghoon Kang
IPC: H01L23/538 , H01L23/544 , H01L23/31 , H01L25/065 , H01L23/00
CPC classification number: H01L23/544 , H01L23/3121 , H01L23/5384 , H01L23/5386 , H01L24/16 , H01L25/0657 , H01L2224/16225 , H01L2225/06517
Abstract: A semiconductor package includes a first semiconductor chip; an encapsulant covering at least a portion of the first semiconductor chip; insulating layers provided on the encapsulant, each of the insulating layers being transparent or translucent; and wiring layers provided on the encapsulant, the wiring layers being partially covered by the insulating layers, wherein an outermost insulating layer of the insulating layers comprises a first region and a second region, a color of the first region is different from a color of the second region, the second region surrounds the first region, and at least one marking pattern comprising at least one step portion is provided in the first region of the outermost insulating layer.
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公开(公告)号:US20220165634A1
公开(公告)日:2022-05-26
申请号:US17405696
申请日:2021-08-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Junghoon Kang
IPC: H01L23/31 , H01L23/538 , H01L23/00 , H01L25/065
Abstract: A semiconductor package includes a first semiconductor chip; an encapsulant covering at least a portion of the first semiconductor chip; insulating layers provided on the encapsulant, each of the insulating layers being transparent or translucent; and wiring layers provided on the encapsulant, the wiring layers being partially covered by the insulating layers, wherein an outermost insulating layer of the insulating layers comprises a first region and a second region, a color of the first region is different from a color of the second region, the second region surrounds the first region, and at least one marking pattern comprising at least one step portion is provided in the first region of the outermost insulating layer.
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公开(公告)号:US11929315B2
公开(公告)日:2024-03-12
申请号:US17527414
申请日:2021-11-16
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Junghoon Kang
IPC: H01L23/498 , H01L23/31 , H01L23/00
CPC classification number: H01L23/49838 , H01L23/3128 , H01L23/49822 , H01L23/49894 , H01L24/16 , H01L2224/16227
Abstract: A semiconductor package including a redistribution substrate having lower and upper surfaces, the redistribution substrate including a pad on the lower surface, the pad having a first surface and a second surface, and a redistribution layer electrically connected to the pad; a semiconductor chip on the upper surface of the redistribution substrate and electrically connected to the redistribution layer; an encapsulant encapsulating at least a portion of the semiconductor chip; and a protective layer on the lower surface of the redistribution substrate and having an opening exposing at least a portion of the first surface of the pad, wherein the portion of the first surface exposed through the opening includes a recess surface including regular depressions and protrusions and being depressed inwardly toward the second surface, and an edge surface including irregular depressions and protrusions and having a step difference with respect to the recess surface.
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公开(公告)号:US20230326871A1
公开(公告)日:2023-10-12
申请号:US18131258
申请日:2023-04-05
Applicant: Samsung Electronics Co., Ltd.
Inventor: Junghoon Kang , Seungwan Shin , Byungmin Yu , Junghyun Lee
IPC: H01L23/544 , H01L25/10 , H01L23/498 , H01L23/31 , B23K26/364
CPC classification number: H01L23/544 , H01L25/105 , H01L23/49833 , H01L23/49838 , H01L23/49816 , H01L24/48 , B23K26/364 , H01L2225/1023 , H01L2225/1041 , H01L2225/1058 , H01L23/3135
Abstract: A semiconductor package includes an encapsulation layer encapsulating at least one semiconductor chip, and a redistribution level layer disposed on the encapsulation layer. The redistribution level layer includes a redistribution layer and a redistribution insulating layer insulating the redistribution layer, a laser mark area is disposed on the redistribution layer and the redistribution insulating layer, and the redistribution insulating layer of the laser mark area comprises a plurality of mesh-type redistribution insulating patterns arranged apart from each other on a plane and surrounded by the redistribution layer. The redistribution level layer includes a laser mark insulating layer located on the redistribution layer and the redistribution insulating layer, wherein the laser mark insulating layer includes a laser mark exposing the redistribution layer and the mesh-type redistribution insulating patterns in the laser mark area.
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公开(公告)号:US20230005843A1
公开(公告)日:2023-01-05
申请号:US17695478
申请日:2022-03-15
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Junghoon Kang
IPC: H01L23/538 , H01L23/31 , H01L23/00 , H01L21/48
Abstract: A method includes attaching a first anisotropic conductive film including first conductive particles to a front surface of a substrate structure; compressing a first redistribution structure on the front surface of the substrate structure such that a first redistribution conductor of the first redistribution structure that is exposed is electrically connected by the first conductive particles to a connection terminal or a vertical connection conductor that is exposed from the substrate structure, attaching a second anisotropic conductive film including second conductive particles to a rear surface of the substrate structure; and compressing a second redistribution structure on the rear surface of the substrate structure such that a second redistribution conductor of the second redistribution structure that is exposed is electrically connected by the second conductive particles to the vertical connection conductor.
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