ANALYSIS APPARATUS AND ELECTRONIC DEVICE
    1.
    发明申请
    ANALYSIS APPARATUS AND ELECTRONIC DEVICE 审中-公开
    分析装置和电子装置

    公开(公告)号:US20150233835A1

    公开(公告)日:2015-08-20

    申请号:US14621913

    申请日:2015-02-13

    Abstract: An analysis apparatus includes an electric field enhancing element including a metallic layer, a light-transmissive layer, and a plurality of metallic particles arranged in a first direction and a second direction intersecting with the first direction; a light source irradiating the electric field enhancing element with at least one of linearly polarized light polarized in the first direction, linearly polarized light polarized in the second direction, and circularly polarized light; and a detector, in which localized surface plasmon and propagating surface plasmon are electromagnetically interacted, and when a thickness of the light-transmissive layer is G [nm], an effective reflective index of the light-transmissive layer is neff, and a wavelength of the excitation light is λi [nm], a relationship of the following expression (1) is satisfied. 20 [nm]

    Abstract translation: 分析装置包括:电场增强元件,包括金属层,透光层和沿与第一方向交叉的第一方向和第二方向布置的多个金属颗粒; 用第一方向偏振的直线偏振光,第二方向偏振的直线偏振光和圆偏振光中的至少一种照射电场增强元件的光源; 以及其中局部表面等离子体激元和传播表面等离子体激元电磁相互作用的检测器,并且当透光层的厚度为G [nm]时,透光层的有效反射率为neff,波长为 激发光为λi[nm],满足下式(1)的关系。 20 [nm]

    SAMPLE ANALYSIS ELEMENT AND DETECTING DEVICE
    2.
    发明申请
    SAMPLE ANALYSIS ELEMENT AND DETECTING DEVICE 有权
    样品分析元件和检测装置

    公开(公告)号:US20130182258A1

    公开(公告)日:2013-07-18

    申请号:US13743919

    申请日:2013-01-17

    CPC classification number: G01N21/55 G01N21/554 G01N21/658 Y10T428/24355

    Abstract: A plurality of metallic nano-body groups that includes metallic nano-bodies which are a size smaller than the wavelength of incident light and are dispersed on a dielectric surface is arranged in one direction at a pitch that resonates with the incident light. A long piece extends on the dielectric surface between adjacent metallic nano-body groups. The long piece is formed of a material having no free electron that performs resonance oscillation with the incident light. Localized surface plasmon resonance occurs in the metallic nano-body by the action of the incident light. Propagating surface plasmon resonance occurs by the action of the pitch. The propagating surface plasmon resonance is combined with the localized surface plasmon resonance. A so-called hybrid mode is established. The long piece is helpful in the establishment of the pitch.

    Abstract translation: 包含比入射光的波长小的分散在电介质面上的金属纳米体的多个金属纳米体组以与入射光共振的间距配置在一个方向。 长片延伸在相邻的金属纳米体组之间的电介质表面上。 长片由不具有与入射光共振的自由电子的材料形成。 局部表面等离子体共振通过入射光的作用发生在金属纳米体内。 传播表面等离子体共振通过间距的作用发生。 传播表面等离子体共振与局部表面等离子体共振共同作用。 建立了所谓的混合模式。 长片有助于建立场地。

    ELECTRONIC FIELD ENHANCEMENT ELEMENT, ANALYSIS DEVICE, AND ELECTRONIC APPARATUS
    4.
    发明申请
    ELECTRONIC FIELD ENHANCEMENT ELEMENT, ANALYSIS DEVICE, AND ELECTRONIC APPARATUS 有权
    电子领域的增强元件,分析装置和电子设备

    公开(公告)号:US20150323444A1

    公开(公告)日:2015-11-12

    申请号:US14706394

    申请日:2015-05-07

    CPC classification number: G01N21/658 G01N21/03 G01N33/483

    Abstract: An electronic field enhancement element includes: a metal layer; a dielectric layer provided on the metal layer; and a plurality of fine metal structures provided on the dielectric layer. A refractive index n of the dielectric layer satisfies n′=n+iκ and is in a range of 1≦n

    Abstract translation: 电子场增强元件包括:金属层; 设置在所述金属层上的电介质层; 以及设置在电介质层上的多个细金属结构体。 介电层的折射率n满足n'= n + i&kgr; 并且在1&lt; nlE; n <1.46的范围内,其中介电层的复折射率为n',虚数单位为i,消光系数为&kgr。

    ANALYSIS DEVICE, ANALYSIS METHOD, OPTICAL ELEMENT USED FOR THE SAME, AND ELECTRONIC APPARATUS
    5.
    发明申请
    ANALYSIS DEVICE, ANALYSIS METHOD, OPTICAL ELEMENT USED FOR THE SAME, AND ELECTRONIC APPARATUS 审中-公开
    分析装置,分析方法,用于其的光学元件和电子装置

    公开(公告)号:US20150070693A1

    公开(公告)日:2015-03-12

    申请号:US14479660

    申请日:2014-09-08

    CPC classification number: G01N21/658

    Abstract: An analysis device is provided with an optical element having a structure in which the end portions of the upper surface and the lower surface of second metal layers are capable of having contact with a measurement object, and hotspots are exposed on the element surfaces. Therefore, it is easy for the substance that is the analysis object to be located at the hotspot. Further, since a first metal layer is disposed in the vicinity of the second metal layers, a resonance effect of a localized surface plasmon and a propagating surface plasmon can be generated. Therefore, the enhancement degree of light based on the plasmon is extremely high, and it is possible to analyze the substance with extremely high sensitivity.

    Abstract translation: 分析装置具有光学元件,该光学元件具有这样的结构,其中第二金属层的上表面和下表面的端部能够与测量对象接触,并且热点暴露在元件表面上。 因此,分析对象物质容易位于热点。 此外,由于第一金属层设置在第二金属层附近,因此可以产生局部表面等离子体激元和传播表面等离子体激元的共振效应。 因此,基于等离子体激光的光的增强度非常高,可以以极高的灵敏度分析物质。

    OPTICAL ELEMENT, ANALYSIS EQUIPMENT, ANALYSIS METHOD AND ELECTRONIC APPARATUS
    7.
    发明申请
    OPTICAL ELEMENT, ANALYSIS EQUIPMENT, ANALYSIS METHOD AND ELECTRONIC APPARATUS 审中-公开
    光学元件,分析设备,分析方法和电子设备

    公开(公告)号:US20140242571A1

    公开(公告)日:2014-08-28

    申请号:US14189244

    申请日:2014-02-25

    Inventor: Mamoru SUGIMOTO

    CPC classification number: G02B5/0816 G01N21/554 G01N21/658 G02B5/008

    Abstract: An optical element includes a metal layer in which a first direction is a thickness direction; metallic particles provided to be spaced from the metal layer in the first direction; and a light transmitting layer that separates the metal layer from the metallic particles, in which the size T of the metallic particles in the first direction satisfies a relationship of 3 nm≦T≦14 nm, and the size D of the metallic particles in a second direction orthogonal to the first direction satisfies a relationship of 30 nm≦D

    Abstract translation: 光学元件包括其中第一方向是厚度方向的金属层; 金属颗粒设置成在第一方向上与金属层隔开; 以及将所述金属层与所述金属粒子分离的透光层,其中,所述金属粒子在所述第一方向上的尺寸T满足3nm&lt; NlE; T&nlE; 14nm的关系,以及所述金属粒子的尺寸D 与第一方向正交的第二方向满足30nm&lt; N1; D <50nm的关系。

    ANALYSIS APPARATUS AND ELECTRONIC DEVICE
    8.
    发明申请
    ANALYSIS APPARATUS AND ELECTRONIC DEVICE 有权
    分析装置和电子装置

    公开(公告)号:US20150233822A1

    公开(公告)日:2015-08-20

    申请号:US14623114

    申请日:2015-02-16

    CPC classification number: G01N21/553 G01N21/41 G01N21/554 G01N21/658

    Abstract: An analysis apparatus includes an electric field enhancing element including a metallic layer, a transmissive layer on the metallic layer and transmitting excitation light, and metallic particles on the transmissive layer with first and second pitches in first and second directions; a light source irradiating the element with first direction linearly polarized light, second direction linearly polarized light, and/or circularly polarized light as the excitation light; and a detector detecting light from the element. The pitches are selected relative to the pitch of a diffraction grating. The thickness of the transmissive layer is selected relative to the wavelength of the excitation light.

    Abstract translation: 一种分析装置包括:电场增强元件,包括金属层,金属层上的透射层和透射激发光;以及在第一和第二方向上具有第一和第二间距的透射层上的金属颗粒; 作为激发光的第一方向线性偏振光,第二方向直线偏振光和/或圆偏振光照射元件的光源; 以及检测器,其检测来自元件的光。 相对于衍射光栅的间距选择间距。 相对于激发光的波长选择透射层的厚度。

    OPTICAL ELEMENT, ANALYSIS DEVICE, ANALYSIS METHOD AND ELECTRONIC APPARATUS
    9.
    发明申请
    OPTICAL ELEMENT, ANALYSIS DEVICE, ANALYSIS METHOD AND ELECTRONIC APPARATUS 审中-公开
    光学元件,分析装置,分析方法和电子装置

    公开(公告)号:US20140242573A1

    公开(公告)日:2014-08-28

    申请号:US14190674

    申请日:2014-02-26

    Inventor: Mamoru SUGIMOTO

    CPC classification number: G02B5/0816 G01N21/553 G01N21/658 G02B5/008

    Abstract: An optical element includes a metal layer having a thickness in a first direction; metallic particles spaced apart from the metal layer in the first direction; and a light transmitting layer separating the metal layer from the metallic particles. The metallic particles are disposed in a lattice shape in a second direction orthogonal to the first direction and in a third direction orthogonal to the first direction and the second direction. A distance between adjacent metal particles in the second and third directions is S, and 6 nm

    Abstract translation: 光学元件包括在第一方向上具有厚度的金属层; 在第一方向上与金属层间隔开的金属颗粒; 以及将金属层与金属颗粒分离的透光层。 金属颗粒在与第一方向正交的第二方向和与第一方向和第二方向正交的第三方向上以格子状布置。 第二和第三方向上相邻金属颗粒之间的距离为S,6nm

    SAMPLE ANALYSIS ELEMENT AND DETECTING DEVICE
    10.
    发明申请
    SAMPLE ANALYSIS ELEMENT AND DETECTING DEVICE 有权
    样品分析元件和检测装置

    公开(公告)号:US20130182257A1

    公开(公告)日:2013-07-18

    申请号:US13743822

    申请日:2013-01-17

    CPC classification number: G01N21/55 G01N21/554

    Abstract: A plurality of metallic nano-body groups that includes metallic nano-bodies which are dispersed on a dielectric surface at a first pitch smaller than the wavelength of incident light is arranged in one direction at a second pitch that resonates with the incident light. Localized surface plasmon resonance occurs in the metallic nano-body by the action of the incident light. Propagating surface plasmon resonance occurs by the action of the second pitch. The propagating surface plasmon resonance is combined with the localized surface plasmon resonance. A so-called hybrid mode is established.

    Abstract translation: 多个金属纳米体组,其以比入射光的波长小的第一间距分散在电介质表面上的金属纳米体以与入射光共振的第二间距布置在一个方向上。 局部表面等离子体共振通过入射光的作用发生在金属纳米体内。 传播表面等离子体共振通过第二节距的作用发生。 传播表面等离子体共振与局部表面等离子体共振共同作用。 建立了所谓的混合模式。

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