公开(公告)号：US20190086458A1

公开(公告)日：2019-03-21

申请号：US15874415

申请日：2018-01-18

Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： Minah SEO ,  Sanghun LEE ,  Chulki KIM ,  Q-Han PARK ,  Jongho CHOE ,  Jinsoo KIM

IPC: G01R27/26 ,  G01N21/3563

CPC classification number: G01R27/2682 ,  G01N21/3563 ,  G01N21/3581 ,  G01N21/8422

Abstract: Disclosed herein is a system for non-contact measurement of an optoelectronic property. The system includes a sensing element configured to amplify an electromagnetic wave having a specific frequency, a thin film disposed on the sensing element such that an optoelectronic property of the thin film is measured, and an optoelectronic property measuring server configured to extract a physical property of the thin film based on the optoelectronic property of the thin film obtained when the electromagnetic wave amplified by the sensing element passes through the thin film.

公开(公告)号：US20180180771A1

公开(公告)日：2018-06-28

申请号：US15808066

申请日：2017-11-09

Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： Minah SEO ,  Sanghun LEE ,  Deokha WOO ,  Jaehun KIM ,  Taikjin LEE ,  Jaebin CHOI ,  Chulki KIM ,  Joo-Hiuk SON ,  Young Min JHON

IPC: G02B1/00 ,  G02B5/20

CPC classification number: G02B1/002 ,  G02B5/20 ,  G02B27/28 ,  H01Q15/0086

Abstract: Disclosed is a metamaterial for an electromagnetic wave filter which includes: a substrate; and a film disposed on the substrate, wherein the film is formed such that a set of slots arranged to form a rotationally symmetric pattern is patterned in an intaglio shape or a set of structures arranged to form a rotationally symmetric pattern is embossed and patterned to control a transmission rate according to polarization of an electromagnetic wave incident on the film.