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公开(公告)号:US11894070B2
公开(公告)日:2024-02-06
申请号:US18156654
申请日:2023-01-19
Applicant: KIOXIA CORPORATION
Inventor: Takeshi Hioka , Tsukasa Kobayashi , Koji Kato , Yuki Shimizu , Hiroshi Maejima
CPC classification number: G11C16/26 , G11C16/08 , G11C16/10 , G11C16/24 , G11C16/30 , H10B43/27 , H10B43/30
Abstract: According to one embodiment, a semiconductor memory device includes first and second memory cells; a first word line connected to the first and second memory cells; a first bit line connected to the first memory cell; a second bit line connected to the second memory cell; a first sense amplifier connected to the first bit line; a second sense amplifier connected to the second bit line; a voltage generation circuit; and a first row decoder which supplies a voltage to the first word line.
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公开(公告)号:US11763890B2
公开(公告)日:2023-09-19
申请号:US17409584
申请日:2021-08-23
Applicant: KIOXIA CORPORATION
Inventor: Yuki Shimizu , Yoshihiko Kamata , Tsukasa Kobayashi , Hideyuki Kataoka , Koji Kato , Takumi Fujimoto , Yoshinao Suzuki , Yuui Shimizu
CPC classification number: G11C16/0483 , G11C7/109 , G11C7/24 , G11C16/08 , G11C16/10 , G11C16/24 , G11C16/28 , G11C16/30
Abstract: A semiconductor memory device includes a substrate, first and second P-type well regions on the substrate, an N-type well region on the substrate and sandwiched between the first and second P-type well regions, a first peripheral circuit on a region of the first P-type well region adjacent to the N-type well region and supplied with a reference voltage via a first wiring, and a second peripheral circuit on a region of the second P-type well region adjacent to the N-type well region and supplied with a reference voltage via a second wiring.
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公开(公告)号:US11133066B2
公开(公告)日:2021-09-28
申请号:US16934978
申请日:2020-07-21
Applicant: KIOXIA CORPORATION
Inventor: Yuki Shimizu , Yoshihiko Kamata , Tsukasa Kobayashi , Hideyuki Kataoka , Koji Kato , Takumi Fujimoto , Yoshinao Suzuki , Yuui Shimizu
Abstract: A semiconductor memory device includes a substrate, first and second P-type well regions on the substrate, an N-type well region on the substrate and sandwiched between the first and second P-type well regions, a first peripheral circuit on a region of the first P-type well region adjacent to the N-type well region and supplied with a reference voltage via a first wiring, and a second peripheral circuit on a region of the second P-type well region adjacent to the N-type well region and supplied with a reference voltage via a second wiring.
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公开(公告)号:US11594285B2
公开(公告)日:2023-02-28
申请号:US17481892
申请日:2021-09-22
Applicant: Kioxia Corporation
Inventor: Takeshi Hioka , Tsukasa Kobayashi , Koji Kato , Yuki Shimizu , Hiroshi Maejima
IPC: G11C16/26 , G11C16/24 , G11C16/08 , H01L27/11568 , G11C16/10 , H01L27/11582 , G11C16/30
Abstract: According to one embodiment, a semiconductor memory device includes first and second memory cells; a first word line connected to the first and second memory cells; a first bit line connected to the first memory cell; a second bit line connected to the second memory cell; a first sense amplifier connected to the first bit line; a second sense amplifier connected to the second bit line; a voltage generation circuit; and a first row decoder which supplies a voltage to the first word line.
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公开(公告)号:US11423980B2
公开(公告)日:2022-08-23
申请号:US17184246
申请日:2021-02-24
Applicant: KIOXIA CORPORATION
Inventor: Yuki Shimizu , Kosuke Yanagidaira
IPC: G11C16/26 , G11C11/56 , G11C16/04 , H01L27/11582 , H01L27/11556
Abstract: A semiconductor storage device includes a first plane storing user data and system information, a second plane storing the user data and the system information, a first latch circuit storing even-numbered bit data of the system information read from the first plane, a second latch circuit storing odd-numbered bit data of the system information read from the second plane, and a sequencer. The sequencer executes in parallel a first process of reading out the even-numbered bit data of the system information from the first plane and storing the read data in the first latch circuit and a second process of reading out the odd-numbered bit data of the system information from the second plane and storing the read data in the second latch circuit.