Defected ground structure to minimize EMI radiation

    公开(公告)号:US10178761B2

    公开(公告)日:2019-01-08

    申请号:US15141131

    申请日:2016-04-28

    Abstract: A multiple-layer circuit board has a signaling layer, an exterior layer, and a ground layer. A pair of differential signal lines implemented as strip lines are within the signaling layer, and propagate electromagnetic interference (EMI) along the signaling layer. An element conductively extends inwards from the exterior layer, and as an antenna radiates the EMI propagated by the strip lines along the signaling layer outwards from the circuit board. A defected ground structure within the ground layer has a size, shape, and a location in relation to the element to suppress the EMI propagated by the strip lines to minimize the EMI that the element radiates outwards as the antenna.

    DEFECTED GROUND STRUCTURE TO MINIMIZE EMI RADIATION

    公开(公告)号:US20170318665A1

    公开(公告)日:2017-11-02

    申请号:US15141131

    申请日:2016-04-28

    CPC classification number: H05K1/0245 H05K1/0225 H05K1/0298 H05K1/115

    Abstract: A multiple-layer circuit board has a signaling layer, an exterior layer, and a ground layer. A pair of differential signal lines implemented as strip lines are within the signaling layer, and propagate electromagnetic interference (EMI) along the signaling layer. An element conductively extends inwards from the exterior layer, and as an antenna radiates the EMI propagated by the strip lines along the signaling layer outwards from the circuit board. A defected ground structure within the ground layer has a size, shape, and a location in relation to the element to suppress the EMI propagated by the strip lines to minimize the EMI that the element radiates outwards as the antenna.

    Determining parameters of PCB structures

    公开(公告)号:US10372857B2

    公开(公告)日:2019-08-06

    申请号:US15138858

    申请日:2016-04-26

    Abstract: One example includes a machine-readable storage medium encoded with instructions. The instructions are executable by a processor of a system to cause the system to receive at least one target electrical characteristic indicating a target impedance of a passive printed circuit board (PCB) structure. The passive PCB structure is a component of a serial communication channel. The instructions are executable by the processor to cause the system to divide the passive PCB structure into a plurality of elements. Each element has an input and an output. The instructions are executable by the processor to cause the system to determine at least one parameter of each element such that an image impedance of the input and the output of each element equals the target impedance.

    DETERMINING PARAMETERS OF PCB STRUCTURES
    7.
    发明申请

    公开(公告)号:US20170308627A1

    公开(公告)日:2017-10-26

    申请号:US15138858

    申请日:2016-04-26

    CPC classification number: G06F17/505 G06F17/5063 G06F17/5081

    Abstract: One example includes a machine-readable storage medium encoded with instructions. The instructions are executable by a processor of a system to cause the system to receive at least one target electrical characteristic indicating a target impedance of a passive printed circuit board (PCB) structure. The passive PCB structure is a component of a serial communication channel. The instructions are executable by the processor to cause the system to divide the passive PCB structure into a plurality of elements. Each element has an input and an output. The instructions are executable by the processor to cause the system to determine at least one parameter of each element such that an image impedance of the input and the output of each element equals the target impedance.

    Bit error ratio tests
    8.
    发明授权

    公开(公告)号:US09712263B1

    公开(公告)日:2017-07-18

    申请号:US15254098

    申请日:2016-09-01

    CPC classification number: H04B17/336 H04B17/318 H04L1/203 H04L1/242

    Abstract: An example communications device may include a slicer that may generate a digital output signal by thresholding a received signal according to variably set timing and voltage parameters. Testing circuitry may determine expected bit error ratios for multiple time-voltage slices by performing test operations corresponding respectively to the multiple time-voltage slices. Each of the test operations may include setting the timing and voltage parameters of the slicer based on the corresponding time-voltage slice, periodically measuring a bit error ratio based on the digital output signal and determining a confidence level for the measured bit error ratio, and in response to the determined confidence level equaling or exceeding a specified value, designating a current value of the measured bit-error ratio as the expected bit error ratio for the corresponding time-voltage slice and ending the test operation.

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