Erase process for use in semiconductor memory device
    1.
    发明授权
    Erase process for use in semiconductor memory device 有权
    用于半导体存储器件的擦除过程

    公开(公告)号:US08374038B2

    公开(公告)日:2013-02-12

    申请号:US12773503

    申请日:2010-05-04

    CPC classification number: G11C16/16 G11C16/0483

    Abstract: A method of erasing memory cells of a memory device includes programming memory cells if the erasing procedure is suspended. The erasing procedure can include pre-programming, erasing, and soft-programming of memory cells in a selected memory unit. If a suspend command is received, for example to allow for a read operation of memory cells of another unit of memory, the erasing procedure stops the pre-programming, erasing, or soft-programming, and proceeds with programming one or more memory cells of the memory unit that was being erased.

    Abstract translation: 擦除存储器件的存储器单元的方法包括如果擦除过程被暂停,则对存储器单元进行编程。 擦除过程可以包括对所选存储器单元中的存储器单元的预编程,擦除和软编程。 如果接收到暂停命令,例如允许对另一个存储单元的存储单元进行读操作,则擦除过程停止预编程,擦除或软编程,并且继续编程一个或多个存储器单元 被擦除的内存单元。

    ERASE PROCESS FOR USE IN SEMICONDUCTOR MEMORY DEVICE
    3.
    发明申请
    ERASE PROCESS FOR USE IN SEMICONDUCTOR MEMORY DEVICE 有权
    用于半导体存储器件的擦除工艺

    公开(公告)号:US20110273936A1

    公开(公告)日:2011-11-10

    申请号:US12773503

    申请日:2010-05-04

    CPC classification number: G11C16/16 G11C16/0483

    Abstract: A method of erasing memory cells of a memory device includes programming memory cells if the erasing procedure is suspended. The erasing procedure can include pre-programming, erasing, and soft-programming of memory cells in a selected memory unit. If a suspend command is received, for example to allow for a read operation of memory cells of another unit of memory, the erasing procedure stops the pre-programming, erasing, or soft-programming, and proceeds with programming one or more memory cells of the memory unit that was being erased.

    Abstract translation: 擦除存储器件的存储器单元的方法包括如果擦除过程被暂停,则对存储器单元进行编程。 擦除过程可以包括对所选存储器单元中的存储器单元的预编程,擦除和软编程。 如果接收到暂停命令,例如允许对另一个存储单元的存储单元进行读操作,则擦除过程停止预编程,擦除或软编程,并且继续编程一个或多个存储器单元 被擦除的内存单元。

    Charge pump utilizing external clock signal
    4.
    发明授权
    Charge pump utilizing external clock signal 有权
    电荷泵利用外部时钟信号

    公开(公告)号:US09225240B2

    公开(公告)日:2015-12-29

    申请号:US12786122

    申请日:2010-05-24

    CPC classification number: H02M3/073

    Abstract: A method of generating a pumping voltage in an integrated circuit includes receiving an external clock signal from outside of the integrated circuit. The frequency of the received external clock signal is changed according to one or more modulation ratios, resulting in one or more respective modulated external clock signal. The external clock signal or one of the modulated external clock signals is then selected for use as a pump clock signal. The pump clock signal is used for driving the pump capacitance of a pump circuit for generating the pumping voltage.

    Abstract translation: 在集成电路中产生泵浦电压的方法包括从集成电路的外部接收外部时钟信号。 接收到的外部时钟信号的频率根据一个或多个调制比而改变,导致一个或多个相应调制的外部时钟信号。 然后选择外部时钟信号或调制的外部时钟信号之一用作泵浦时钟信号。 泵时钟信号用于驱动泵电路的泵电容以产生泵浦电压。

    Memory chip and method for operating the same
    6.
    发明授权
    Memory chip and method for operating the same 有权
    内存芯片及其操作方法

    公开(公告)号:US08203896B2

    公开(公告)日:2012-06-19

    申请号:US12911173

    申请日:2010-10-25

    CPC classification number: G11C29/022 G11C29/02

    Abstract: A memory chip and method for operating the same are provided. The memory chip includes a number of pads. The method includes inputting a number of first test signals to the pads respectively, wherein the first test signals corresponding to two physically-adjacent pads are complementary; inputting a number of second test signals, respectively successive to the first test signals, to the pads, wherein the first test signal and the second test signal corresponding to each of the pads are complementary; and outputting expected data from the memory chip if the first test signals and the second test signals are successfully received by the memory chip.

    Abstract translation: 提供了一种存储芯片及其操作方法。 存储器芯片包括多个焊盘。 该方法包括分别将多个第一测试信号输入到焊盘,其中对应于两个物理相邻的焊盘的第一测试信号是互补的; 将多个分别连续到第一测试信号的第二测试信号输入到焊盘,其中对应于每个焊盘的第一测试信号和第二测试信号是互补的; 以及如果所述第一测试信号和所述第二测试信号被所述存储芯片成功接收,则从所述存储器芯片输出预期数据。

    CHARGE PUMP UTILIZING EXTERNAL CLOCK SIGNAL
    7.
    发明申请
    CHARGE PUMP UTILIZING EXTERNAL CLOCK SIGNAL 有权
    充电泵使用外部时钟信号

    公开(公告)号:US20110115551A1

    公开(公告)日:2011-05-19

    申请号:US12786122

    申请日:2010-05-24

    CPC classification number: H02M3/073

    Abstract: A method of generating a pumping voltage in an integrated circuit includes receiving an external clock signal from outside of the integrated circuit. The frequency of the received external clock signal is changed according to one or more modulation ratios, resulting in one or more respective modulated external clock signal. The external clock signal or one of the modulated external clock signals is then selected for use as a pump clock signal. The pump clock signal is used for driving the pump capacitance of a pump circuit for generating the pumping voltage.

    Abstract translation: 在集成电路中产生泵浦电压的方法包括从集成电路的外部接收外部时钟信号。 接收到的外部时钟信号的频率根据一个或多个调制比而改变,导致一个或多个相应调制的外部时钟信号。 然后选择外部时钟信号或调制的外部时钟信号之一用作泵浦时钟信号。 泵时钟信号用于驱动泵电路的泵电容以产生泵浦电压。

    Word Line Decoder Circuit Apparatus and Method
    8.
    发明申请
    Word Line Decoder Circuit Apparatus and Method 有权
    字线解码器电路设备及方法

    公开(公告)号:US20110069571A1

    公开(公告)日:2011-03-24

    申请号:US12816960

    申请日:2010-06-16

    CPC classification number: G11C16/16

    Abstract: One embodiment of the technology is an apparatus, a memory integrated circuit. The memory integrated circuit has word line address decoding circuitry. The circuit allows selection of a single word line to have an erase voltage. A decoder circuit includes an inverter and logic. The inverter has an input, and an output controlling a word line to perform the erase operation. A voltage range of the input extends between a first voltage reference and a second voltage reference. Examples of voltages references are a voltage supply and a ground. In some embodiments, this wide voltage range results from the input being free of a threshold voltage drop from preceding circuitry limiting the voltage range of the input. The logic of the decoder is circuit is controlled by a word line address to determine a value of the input of the inverter during the erase operation.

    Abstract translation: 该技术的一个实施例是一种装置,存储器集成电路。 存储器集成电路具有字线地址解码电路。 该电路允许选择单个字线以具有擦除电压。 解码器电路包括反相器和逻辑。 逆变器具有输入和控制字线的输出以执行擦除操作。 输入的电压范围在第一参考电压和第二电压基准之间延伸。 电压基准的示例是电压源和地。 在一些实施例中,该宽电压范围来自于输入端没有来自限制输入的电压范围的前一电路的阈值电压降。 解码器的逻辑电路由字线地址控制,以在擦除操作期间确定反相器的输入值。

    Semiconductor device including memory cells and current limiter
    10.
    发明授权
    Semiconductor device including memory cells and current limiter 有权
    半导体器件包括存储单元和限流器

    公开(公告)号:US07355903B2

    公开(公告)日:2008-04-08

    申请号:US11181983

    申请日:2005-07-15

    CPC classification number: G11C16/24

    Abstract: A semiconductor device, including a memory cell having a control gate, a source and drain; and a current limiting circuit coupled to the source. The current limiting circuit may be configured to limit a current between the drain and source to not exceed a predetermined value; the current being generated in response to application of first and second voltages to the control gate and drain, respectively. The current limiting circuit may include a transistor comprising a first terminal, a second terminal, and a third terminal, wherein the first terminal may include a source of the transistor, the third terminal may include a drain of the transistor, and the second terminal may include a gate of the transistor, and wherein a stable bias may be applied to the second terminal of the transistor.

    Abstract translation: 一种半导体器件,包括具有控制栅极,源极和漏极的存储单元; 以及耦合到源极的限流电路。 电流限制电路可以被配置为将漏极和源极之间的电流限制为不超过预定值; 响应于分别向控制栅极和漏极施加第一和第二电压而产生电流。 电流限制电路可以包括包括第一端子,第二端子和第三端子的晶体管,其中第一端子可以包括晶体管的源极,第三端子可以包括晶体管的漏极,并且第二端子可以 包括晶体管的栅极,并且其中可以将稳定的偏压施加到晶体管的第二端子。

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