公开(公告)号：US11145249B1

公开(公告)日：2021-10-12

申请号：US16930204

申请日：2020-07-15

Applicant: Apple Inc.

Inventor： Wanglei Han ,  Akshay Bhat ,  Michael H. Lim ,  Kyung Hoae Koo ,  Jiayi Jin ,  David A. Doyle ,  Tae-Wook Koh ,  Jared S. Price ,  Yifan Zhang ,  Mahdi Nezamabadi

IPC: G09G3/3225 ,  G09G3/00

Abstract: A display may include pixels (such as light-emitting diode pixels) that are susceptible aging effects (burn-in). To help avoid visible artifacts caused by burn-in during operation of the display, compensation circuitry may be used to compensate image data for the display. An optical sensor may be included behind the pixels to directly measure pixel brightness levels. The optical sensor may provide optical sensor data from testing operations to the compensation circuitry. The optical sensor may gather data during burn-in testing operations. During the burn-in testing operations, pixel groups including both high-usage pixels and low-usage pixels may sequentially emit light while the optical sensor gathers data. Brightness differences between the high-usage pixels and low-usage pixels may be used to characterize pixel aging in the display and compensate image data to mitigate visible artifacts caused by burn-in. The optical sensor may also gather data during global brightness testing operations.