公开(公告)号：US20240345164A1

公开(公告)日：2024-10-17

申请号：US18312600

申请日：2023-05-05

Applicant: ASMedia Technology Inc.

Inventor： Te-Ming Kung

IPC: G01R31/3185 ,  G01R31/317 ,  G01R31/3183

CPC classification number: G01R31/318572 ,  G01R31/31723 ,  G01R31/318371

Abstract: A testing system and a testing method are provided. The testing system includes a first testing device and a second testing device. The first testing device is coupled to a first stream facing-port of a device under test (DUT). The first testing device includes a controller. The second testing device is coupled to a second stream facing-port of the DUT. The controller transmits a testing signal to the DUT through the first stream facing-port to test a universal serial bus (USB) of the DUT. The DUT is operated based on the testing signal to generate a data signal. The DUT outputs the data signal to the second testing device through the second stream facing-port. The second testing device obtains status information of the DUT which is operated based on the testing signal 10 to generate a testing result. The controller determines whether the DUT is normal according to the testing result.

公开(公告)号：US12181536B2

公开(公告)日：2024-12-31

申请号：US18178514

申请日：2023-03-05

Applicant: ASMedia Technology Inc.

Inventor： Te-Ming Kung ,  Yi-Chung Tsai ,  Shih-Min Lin

IPC: G01R31/66

Abstract: A testing circuit for testing a universal serial bus (USB) of an electronic device includes a controller, a first switch, a pull-down resistor, a gating pull-up resistor, and a second switch. The controller provides a control signal according to a power receiving condition of the electronic device. A control terminal of the first switch is coupled to the controller. The pull-down resistor is coupled between a configuration channel pin of the USB and a first terminal of the first switch. The gating pull-up resistor is coupled between the configuration channel pin and the control terminal of the first switch. A control terminal of the second switch is coupled to the controller. A first terminal of the second switch is coupled to a second terminal of the first switch and a ground pin of the USB. A second terminal of the second switch is coupled to a reference low voltage.

公开(公告)号：US20240248151A1

公开(公告)日：2024-07-25

申请号：US18178514

申请日：2023-03-05

Applicant: ASMedia Technology Inc.

Inventor： Te-Ming Kung ,  Yi-Chung Tsai ,  Shih-Min Lin

IPC: G01R31/66

CPC classification number: G01R31/66

Abstract: A testing circuit for testing a universal serial bus (USB) of an electronic device includes a controller, a first switch, a pull-down resistor, a gating pull-up resistor, and a second switch. The controller provides a control signal according to a power receiving condition of the electronic device. A control terminal of the first switch is coupled to the controller. The pull-down resistor is coupled between a configuration channel pin of the USB and a first terminal of the first switch. The gating pull-up resistor is coupled between the configuration channel pin and the control terminal of the first switch. A control terminal of the second switch is coupled to the controller. A first terminal of the second switch is coupled to a second terminal of the first switch and a ground pin of the USB. A second terminal of the second switch is coupled to a reference low voltage.