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1.发明授权Apparatus and method for inspecting interface between ground layer and substrate of microstrip by using scattering parameters 失效通过使用散射参数检测微带接地层和衬底之间的界面的装置和方法公开(公告)号：US07170300B2
公开(公告)日：2007-01-30
申请号：US10917822
申请日：2004-08-12
Applicant: Sung-Tek Kahng , Jong-Won Eun , Seong-Pal Lee
Inventor： Sung-Tek Kahng , Jong-Won Eun , Seong-Pal Lee
CPC classification number: G01R31/2822 , G01R27/28
Abstract: An apparatus and method for detecting a defect on a ground layer of microstrip by using scattering parameters is disclosed. The apparatus includes: a providing unit for providing a signal to the microstrip by changing a frequency of the signal in a predetermined range of frequencies; a detecting unit for detecting scattering parameters of an output signal from the microstrip in response to the frequency of the signal; and an analyzing unit for analyzing the interface based on the scattering parameters.
Abstract translation: 公开了一种通过使用散射参数来检测微带接地层上的缺陷的装置和方法。 该装置包括：提供单元，用于通过在预定频率范围内改变信号的频率来向微带提供信号; 检测单元，用于响应于信号的频率来检测来自微带的输出信号的散射参数; 以及用于基于散射参数分析界面的分析单元。
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公开(公告)号：US09768505B2
公开(公告)日：2017-09-19
申请号：US13978359
申请日：2011-10-10
Applicant: Jeong Hoon Cho , Kyung Suk Kim , Ja Kwon Ku , Sung Tek Kahng , Geon Ho Jang , Seong Ryong Yoo
Inventor： Jeong Hoon Cho , Kyung Suk Kim , Ja Kwon Ku , Sung Tek Kahng , Geon Ho Jang , Seong Ryong Yoo
Abstract: A multi input multi output (MIMO) antenna with no phase change is provided. The MIMO antenna having no phase change constituting one antenna structure overall, wherein unit structures at both sides are symmetrical to each other in a meander form with respect to the center; the unit structures having the meander form are connected to a ground plate by using as a medium power feeding units 240 and 250 supplying an electric energy to the respective unit structures; and the unit structures are installed with a three-dimensional structure, being adjacent to the ground plate.
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公开(公告)号：US07002359B2
公开(公告)日：2006-02-21
申请号：US10830129
申请日：2004-04-21
Applicant: Sung-Tek Kahng , Jong-Won Eun , Seong-Pal Lee
Inventor： Sung-Tek Kahng , Jong-Won Eun , Seong-Pal Lee
IPC: G01R27/28
CPC classification number: G01R31/001 , H05K9/0069
Abstract: An apparatus and a method for measuring an electric magnetic interference (EMI) level of a radio frequency device is disclosed. The apparatus for measuring a level of electric magnetic interference (EMI) with an electronic device to radiate an electromagnetic wave, the apparatus including: a test device for outputting a signal in response to the electromagnetic wave radiated from the electric device; a calculating unit for calculating a group_delay variation information of the test device by using the signal from the test device; a processor for storing a reference group_delay variation; and an analyzer for analyzing the level of EMI by comparing the reference group_delay variation information and the group_delay variation information.
Abstract translation: 公开了一种用于测量射频设备的电磁干扰（EMI）电平的装置和方法。 一种用于测量电子装置的电磁干扰（EMI）水平辐射电磁波的装置，该装置包括：用于响应于从电气装置辐射的电磁波输出信号的测试装置; 计算单元，用于通过使用来自测试装置的信号来计算测试装置的组延迟变化信息; 用于存储参考组延迟变化的处理器; 以及分析器，用于通过比较参考组延迟变化信息和组延迟变化信息来分析EMI的水平。
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4.发明申请Apparatus and method for inspecting interface between ground layer and substrate of microstrip by using scattering parameters 失效通过使用散射参数检测微带接地层和衬底之间的界面的装置和方法
公开(公告)号：US20050127892A1
公开(公告)日：2005-06-16
申请号：US10917822
申请日：2004-08-12
Applicant: Sung-Tek Kahng , Jong-Won Eun , Seong-Pal Lee
Inventor： Sung-Tek Kahng , Jong-Won Eun , Seong-Pal Lee
CPC classification number: G01R31/2822 , G01R27/28
Abstract: An apparatus and method for detecting a defect on a ground layer of microstrip by using scattering parameters is disclosed. The apparatus includes: a providing unit for providing a signal to the microstrip by changing a frequency of the signal in a predetermined range of frequencies; a detecting unit for detecting scattering parameters of an output signal from the microstrip in response to the frequency of the signal; and an analyzing unit for analyzing the interface based on the scattering parameters.
Abstract translation: 公开了一种通过使用散射参数来检测微带接地层上的缺陷的装置和方法。 该装置包括：提供单元，用于通过在预定频率范围内改变信号的频率来向微带提供信号; 检测单元，用于响应于信号的频率来检测来自微带的输出信号的散射参数; 以及用于基于散射参数分析界面的分析单元。
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公开(公告)号：US20140055319A1
公开(公告)日：2014-02-27
申请号：US13978359
申请日：2011-10-10
Applicant: Jeong Hoon Cho , Kyung Suk Kim , Ja Kwon Ku , Sung Tek Kahng , Geon Ho Jang , Seong Ryong Yoo
Inventor： Jeong Hoon Cho , Kyung Suk Kim , Ja Kwon Ku , Sung Tek Kahng , Geon Ho Jang , Seong Ryong Yoo
IPC: H01Q5/00
Abstract: A multi input multi output (MIMO) antenna with no phase change is provided. The MIMO antenna having no phase change constituting one antenna structure overall, wherein unit structures at both sides are symmetrical to each other in a meander form with respect to the center; the unit structures having the meander form are connected to a ground plate by using as a medium power feeding units 240 and 250 supplying an electric energy to the respective unit structures; and the unit structures are installed with a three-dimensional structure, being adjacent to the ground plate.
Abstract translation: 提供了一种没有相位变化的多输入多输出（MIMO）天线。 没有相位变化的MIMO天线整体构成一个天线结构，其中两侧的单位结构相对于中心以曲折的形式相互对称; 具有曲折形式的单元结构通过使用向各个单元结构提供电能的中等供电单元240和250连接到接地板; 并且单元结构安装有与接地板相邻的三维结构。
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公开(公告)号：US20050134291A1
公开(公告)日：2005-06-23
申请号：US10830129
申请日：2004-04-21
Applicant: Sung-Tek Kahng , Jong-Won Eun , Seong-Pal Lee
Inventor： Sung-Tek Kahng , Jong-Won Eun , Seong-Pal Lee
CPC classification number: G01R31/001 , H05K9/0069
Abstract: An apparatus and a method for measuring an electric magnetic interference (EMI) level of a radio frequency device is disclosed. The apparatus for measuring a level of electric magnetic interference (EMI) with an electronic device to radiate an electromagnetic wave, the apparatus including: a test device for outputting a signal in response to the electromagnetic wave radiated from the electric device; a calculating unit for calculating a group_delay variation information of the test device by using the signal from the test device; a processor for storing a reference group_delay variation; and an analyzer for analyzing the level of EMI by comparing the reference group_delay variation information and the group_delay variation information.
Abstract translation: 公开了一种用于测量射频设备的电磁干扰（EMI）电平的装置和方法。 一种用于测量电子装置的电磁干扰（EMI）水平辐射电磁波的装置，该装置包括：用于响应于从电气装置辐射的电磁波输出信号的测试装置; 计算单元，用于通过使用来自测试装置的信号来计算测试装置的组延迟变化信息; 用于存储参考组延迟变化的处理器; 以及分析器，用于通过比较参考组延迟变化信息和组延迟变化信息来分析EMI的水平。
