CONNECTOR WITH LATCH PROTECTION
    1.
    发明申请

    公开(公告)号:US20190123476A1

    公开(公告)日:2019-04-25

    申请号:US16124200

    申请日:2018-09-07

    Applicant: Po-Hung Chen

    Inventor: Po-Hung Chen

    Abstract: A connector with latch protection includes a metal casing, an insulating body, plural metal terminals and a partition. The insulating body covers the interior of the metal casing and has a tab extended forwardly from the front of the insulating body and disposed apart on the top and bottom of the tab respectively, and both sides of the tab corresponding to a connecting plug form an inwardly concave portion, and both sides of the partition have a protection plate corresponding to each inwardly concave portion and the front of the tab and bent and extended forwardly. When the partition is embedded into the insulating body by a molding method, a portion of the two metal protection plates exposed from the tab forms a pair of latch grooves for latching the connecting plug to effectively improve the durability and life and lower the manufacturing cost of the connector significantly.

    Voltage detecting circuit
    2.
    发明授权
    Voltage detecting circuit 有权
    电压检测电路

    公开(公告)号:US09000751B2

    公开(公告)日:2015-04-07

    申请号:US13396235

    申请日:2012-02-14

    CPC classification number: G01R19/16519 G01F3/20

    Abstract: In a voltage detecting circuit, a transistor is configured as a P-type MOSFET, and includes a source connected with an input terminal, a gate connected with a ground voltage terminal and a drain connected with an output terminal. A transistor is configured as a P-type MOSFET, and includes a gate and a source connected with the output terminal and a drain connected with the ground terminal. Gate width and gate length of the transistor and gate width and gate length of the transistor are adjusted so that source-drain current flowing between the source and the drain of the transistor becomes equal to source-drain current flowing between the source and the drain of the transistor when the voltage applied to the input terminal is set to be preset trigger voltage. This configuration accomplishes detecting that the input voltage exceeds the trigger voltage with simple configuration.

    Abstract translation: 在电压检测电路中,晶体管被配置为P型MOSFET,并且包括与输入端连接的源极,与接地电压端子连接的栅极和与输出端子连接的漏极。 晶体管被配置为P型MOSFET,并且包括与输出端连接的栅极和源极以及与接地端子连接的漏极。 调节晶体管的栅极宽度和栅极长度,并调整晶体管的栅极宽度和栅极长度,使得在晶体管的源极和漏极之间流动的源极 - 漏极电流变得等于在源极和漏极之间流动的源极 - 漏极电流 当施加到输入端子的电压被设置为预置触发电压时,晶体管。 该配置通过简单的配置实现了输入电压超过触发电压的检测。

    Electrical fuse programming time control scheme
    3.
    发明授权
    Electrical fuse programming time control scheme 有权
    电熔丝编程时间控制方案

    公开(公告)号:US08427857B2

    公开(公告)日:2013-04-23

    申请号:US12774851

    申请日:2010-05-06

    CPC classification number: G11C17/16 G11C17/18

    Abstract: A circuit includes a fuse and a sensing and control circuit. The fuse is coupled between a MOS transistor and a current source node. The sensing and control circuit is configured to receive a programming pulse and output a modified programming signal to the gate of the MOS transistor for programming the fuse. The modified programming signal has a pulse width based on a magnitude of a current through the first fuse.

    Abstract translation: 电路包括熔丝和感测和控制电路。 熔丝耦合在MOS晶体管和电流源节点之间。 感测和控制电路被配置为接收编程脉冲并将修改的编程信号输出到MOS晶体管的栅极,以编程保险丝。 改进的编程信号具有基于通过第一保险丝的电流的幅度的脉冲宽度。

    VOLTAGE DETECTING CIRCUIT
    4.
    发明申请
    VOLTAGE DETECTING CIRCUIT 有权
    电压检测电路

    公开(公告)号:US20120212212A1

    公开(公告)日:2012-08-23

    申请号:US13396235

    申请日:2012-02-14

    CPC classification number: G01R19/16519 G01F3/20

    Abstract: In a voltage detecting circuit, a transistor is configured as a P-type MOSFET, and includes a source connected with an input terminal, a gate connected with a ground voltage terminal and a drain connected with an output terminal. A transistor is configured as a P-type MOSFET, and includes a gate and a source connected with the output terminal and a drain connected with the ground terminal. Gate width and gate length of the transistor and gate width and gate length of the transistor are adjusted so that source-drain current flowing between the source and the drain of the transistor becomes equal to source-drain current flowing between the source and the drain of the transistor when the voltage applied to the input terminal is set to be preset trigger voltage. This configuration accomplishes detecting that the input voltage exceeds the trigger voltage with simple configuration.

    Abstract translation: 在电压检测电路中,晶体管被配置为P型MOSFET,并且包括与输入端连接的源极,与接地电压端子连接的栅极和与输出端子连接的漏极。 晶体管被配置为P型MOSFET,并且包括与输出端连接的栅极和源极以及与接地端子连接的漏极。 调节晶体管的栅极宽度和栅极长度,并调整晶体管的栅极宽度和栅极长度,使得在晶体管的源极和漏极之间流动的源极 - 漏极电流变得等于在源极和漏极之间流动的源极 - 漏极电流 当施加到输入端子的电压被设置为预置触发电压时,晶体管。 该配置通过简单的配置实现了输入电压超过触发电压的检测。

    CACHE CONTROLLER, METHOD FOR CONTROLLING THE CACHE CONTROLLER, AND COMPUTING SYSTEM COMPRISING THE SAME
    5.
    发明申请
    CACHE CONTROLLER, METHOD FOR CONTROLLING THE CACHE CONTROLLER, AND COMPUTING SYSTEM COMPRISING THE SAME 有权
    缓存控制器,控制缓存控制器的方法以及包含其的计算系统

    公开(公告)号:US20100325364A1

    公开(公告)日:2010-12-23

    申请号:US12489795

    申请日:2009-06-23

    CPC classification number: G06F12/126 G06F12/0802 G06F12/0848

    Abstract: A cache controller, a method for controlling the cache controller, and a computing system comprising the same are provided. The computer system comprises a processor and a cache controller. The cache controller is electrically connected to the processor and comprises a first port, a second port, and at least one cache. The first port is configured to receive an address of a content, wherein a type of the content is one of instruction and data. The second port is configured to receive an information bit corresponding to the content, wherein the information bit indicates the type of the content. The at least one cache comprises at least one cache lines. Each of the cache lines comprises a content field and corresponding to an information field. The content and the information bit is stored in the content field of one of the cache lines and the corresponding information field respectively according to the information bit and the address. Thereby, instruction and data are separated in a unified cache.

    Abstract translation: 提供了缓存控制器,用于控制高速缓存控制器的方法,以及包括该控制器的计算系统。 计算机系统包括处理器和高速缓存控制器。 高速缓存控制器电连接到处理器,并且包括第一端口,第二端口和至少一个高速缓存。 第一端口被配置为接收内容的地址,其中内容的类型是指令和数据之一。 第二端口被配置为接收对应于内容的信息位,其中信息位指示内容的类型。 至少一个高速缓存包括至少一个高速缓存行。 每个高速缓存行包括与信息字段对应的内容字段。 内容和信息位分别根据信息位和地址存储在高速缓存线之一的内容字段和对应的信息字段中。 因此,指令和数据在统一缓存中分离。

    Display Device with Low Scratch Visibility and Manufacturing Method Thereof
    6.
    发明申请
    Display Device with Low Scratch Visibility and Manufacturing Method Thereof 有权
    具有低刮痕可见性的显示装置及其制造方法

    公开(公告)号:US20100066944A1

    公开(公告)日:2010-03-18

    申请号:US12544813

    申请日:2009-08-20

    CPC classification number: G02B6/0053 G02B5/0231 G02B5/0278

    Abstract: A display device and a manufacturing method thereof are provided. The display device includes a light guide, a light source, and a brightness enhancement film (BEF), and a dual brightness enhancement film (DBEF). The light guide has a first edge along a first direction and a second edge adjacent to the first edge corresponding to the light source. The BEF is disposed on the light guide and has a plurality of prisms along a second direction which rotates from 0 to 90 degrees with respect to the first direction. The DBEF has a transmission axis along a third direction which also rotates from 0 to 90 degrees with respect to the first direction.

    Abstract translation: 提供了显示装置及其制造方法。 显示装置包括光导,光源和亮度增强膜(BEF)和双亮度增强膜(DBEF)。 光导具有沿着第一方向的第一边缘和与对应于光源的第一边缘相邻的第二边缘。 BEF设置在光导上,并且沿着相对于第一方向从0转到90度的第二方向具有多个棱镜。 DBEF具有沿着第三方向的传动轴,其相对于第一方向也从0转到90度。

    Methods of testing fuse elements for memory devices
    7.
    发明申请
    Methods of testing fuse elements for memory devices 失效
    测试存储器件熔丝元件的方法

    公开(公告)号:US20080238439A1

    公开(公告)日:2008-10-02

    申请号:US11731960

    申请日:2007-04-02

    CPC classification number: G11C29/02 G11C17/165 G11C29/027

    Abstract: A method of testing a fuse element for a memory device is provided. A first test probe is electrically connected to a program terminal of the memory device. A second test probe is electrically connected to a ground terminal. The fuse element is on an electrical circuit path between the program terminal and the ground terminal. The first and second test probes are electrically connected to a testing device. A first voltage is applied with the testing device between the program terminal and the ground terminal. At least part of a first current of the first voltage flows across the fuse element. The first voltage and the at least part of the first current that flows across the fuse element is not large enough to change the conductivity state of the fuse element. The first current is measured and used to evaluated the conductive state of the fuse element.

    Abstract translation: 提供一种测试用于存储器件的熔丝元件的方法。 第一测试探针电连接到存储器件的程序终端。 第二测试探针电连接到接地端子。 保险丝元件位于程序端子和接地端子之间的电路上。 第一和第二测试探针电连接到测试装置。 测试设备在程序终端和接地端子之间施加第一个电压。 第一电压的第一电流的至少一部分流过熔丝元件。 在熔断元件上流动的第一电流和第一电流的至少一部分不足以改变熔丝元件的导电状态。 测量第一电流并用于评估熔丝元件的导电状态。

    Packaging method of a light-sensing semiconductor device and packaging structure thereof
    8.
    发明申请
    Packaging method of a light-sensing semiconductor device and packaging structure thereof 审中-公开
    光敏半导体器件的封装方法及其封装结构

    公开(公告)号:US20070075236A1

    公开(公告)日:2007-04-05

    申请号:US11239028

    申请日:2005-09-30

    Abstract: The present invention discloses a packaging method of a light-sensing semiconductor device and a packaging structure thereof, wherein a matrix of spacer walls is formed on a light-sensing wafer, which has multiple light-sensing chips, and the adhesive is directly applied to between two neighboring spacer walls on the non-light-sensing regions. Thus, when the light transparent cover is installed, there is no more adhesive dropping onto the light-sensing regions of the light-sensing chips. Further, when the light transparent cover is pressed to join with the spacer walls, with the trenches formed at the tops of the spacer walls, the adhesive will not overflow from the joint seams into the light-sensing regions.

    Abstract translation: 本发明公开了一种感光半导体器件及其封装结构的封装方法,其中在具有多个光感测芯片的感光晶片上形成间隔壁矩阵,并将该粘合剂直接施加到 在非感光区域上的两个相邻间隔壁之间。 因此,当安装光透明盖时,没有更多的粘合剂落在感光片的感光区上。 此外,当将光透明盖按压以与间隔壁接合时,其中沟槽形成在间隔壁的顶部处,粘合剂将不会从接缝处溢出进入感光区域。

    Package structure for an optical sensor
    9.
    发明申请
    Package structure for an optical sensor 审中-公开
    光学传感器的封装结构

    公开(公告)号:US20070057169A1

    公开(公告)日:2007-03-15

    申请号:US11225076

    申请日:2005-09-14

    Abstract: The present invention relates to a package structure for an optical sensor having a base set with the plurality of metallization traces on its upper and under surface and several conductors passing through the base electrically connects to the plurality of metallization traces on the surface; at least one optical sensor and its peripheral frame are set upon the base in which the conductors can be located within the frame area or the area between the optical sensor and the frame; and a light-pervious lid encapsulates the frame and completes the package structure. In addition, an enclosing base having a containing capacity can be adopted to replace the base and the frame. The present invention can efficiently raise the reliability of elements and yield and quality by said package structure.

    Abstract translation: 本发明涉及一种用于光学传感器的封装结构,其具有在其上表面和下表面上具有多个金属化迹线的基座,并且穿过基座的多个导体电连接到表面上的多个金属化迹线; 至少一个光学传感器及其外围框架设置在基座上,导体可以位于框架区域内或光学传感器与框架之间的区域内; 并且透光的盖子封装框架并完成封装结构。 此外,可以采用具有容纳能力的封闭基座来代替基座和框架。 本发明可以通过所述包装结构有效提高元件的可靠性和产量和质量。

    Vacuum thermal cooker
    10.
    发明授权
    Vacuum thermal cooker 失效
    真空热煲

    公开(公告)号:US5347918A

    公开(公告)日:1994-09-20

    申请号:US223718

    申请日:1994-04-06

    Applicant: Po-Hung Chen

    Inventor: Po-Hung Chen

    Abstract: A vacuum thermal cooker comprising an outer cooler, an inner cooker, a sealing lid unit and an insulating disc, the inner cooker being used for boiling food and then to be placed in the outer cooker sealed by the sealing lid unit and then the air in the outer cooker being sucked out by a separate simple sucking pump operated by hand, the interior of the outer cooker becoming vacuum so that the heat of the food and the inner cooker may be kept for a long period of time, not easily cooled off by function of the vacuum condition of the outer cooker.

    Abstract translation: 一种真空热炊具,包括外部冷却器,内部炊具,密封盖单元和绝缘盘,所述内部炊具用于沸腾食物,然后被放置在由密封盖单元密封的外部炊具中,然后将空气 外部炊具被单独操作的简单的吸入泵吸出,外部炊具的内部变得真空,使得食物和炊具的热量可以长时间保持,不容易被冷却 外锅的真空条件功能。

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