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61.
公开(公告)号:US20230197676A1
公开(公告)日:2023-06-22
申请号:US17557166
申请日:2021-12-21
Applicant: Intel Corporation
Inventor: Gerald S. Pasdast , Adel A. Elsherbini , Nevine Nassif , Carleton L. Molnar , Vivek Kumar Rajan , Peipei Wang , Shawna M. Liff , Tejpal Singh , Johanna M. Swan
IPC: H01L25/065 , H01L23/498
CPC classification number: H01L25/0652 , H01L23/49827 , H01L23/49894 , H01L23/49838
Abstract: A microelectronic assembly is provided, comprising: a first integrated circuit (IC) die having a first connection to a first serializer/deserializer (SERDES) circuit and a second connection to a second SERDES circuit; a second IC die having the first SERDES circuit; and a third IC die having the second SERDES circuit, in which the first IC die is in a first layer, the second IC die and the third IC die are in a second layer not coplanar with the first layer, the first layer and the second layer are coupled by interconnects having a pitch of less than 10 micrometers between adjacent ones of the interconnects, and the first SERDES circuit and the second SERDES circuit are coupled by a conductive pathway.
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公开(公告)号:US11676918B2
公开(公告)日:2023-06-13
申请号:US17677877
申请日:2022-02-22
Applicant: Intel Corporation
Inventor: Adel A. Elsherbini , Feras Eid , Johanna M. Swan , Aleksandar Aleksov , Veronica Aleman Strong
CPC classification number: H01L23/60 , H01L23/481 , H01L23/49816 , H01L24/13 , H01L24/14 , H01L24/16 , H01L27/0248 , H01L2224/13024 , H01L2224/14181 , H01L2224/16145 , H01L2224/16225
Abstract: Disclosed herein are structures, devices, and methods for electrostatic discharge protection (ESDP) in integrated circuits (ICs). For example, in some embodiments, an IC package support may include: a first conductive structure in a dielectric material; a second conductive structure in the dielectric material; and a material in contact with the first conductive structure and the second conductive structure, wherein the material includes a polymer, and the material is different from the dielectric material. The material may act as a dielectric material below a trigger voltage, and as a conductive material above the trigger voltage.
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公开(公告)号:US20230133235A1
公开(公告)日:2023-05-04
申请号:US18090801
申请日:2022-12-29
Applicant: Intel Corporation
Inventor: Adel A. Elsherbini , Feras Eid , Johanna M. Swan , Shawna M. Liff
IPC: H01L25/065 , H01L25/18 , H01L25/00 , H01L23/00
Abstract: Microelectronic assemblies, related devices and methods, are disclosed herein. In some embodiments, a microelectronic assembly may include a package substrate having a first surface and an opposing second surface; a first die having a first surface and an opposing second surface embedded in a first dielectric layer, where the first surface of the first die is coupled to the second surface of the package substrate by first interconnects; a second die having a first surface and an opposing second surface embedded in a second dielectric layer, where the first surface of the second die is coupled to the second surface of the first die by second interconnects; and a third die having a first surface and an opposing second surface embedded in a third dielectric layer, where the first surface of the third die is coupled to the second surface of the second die by third interconnects.
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公开(公告)号:US20230077949A1
公开(公告)日:2023-03-16
申请号:US17958300
申请日:2022-09-30
Applicant: Intel Corporation
Inventor: Telesphor Kamgaing , Adel A. Elsherbini , Sasha N. Oster
IPC: H01L23/66 , H01L21/48 , H01L23/498
Abstract: In various embodiments, disclosed herein are systems and methods directed to the fabrication of a coreless semiconductor package (e.g., a millimeter (mm)-wave antenna package) having an asymmetric build-up layer count that can be fabricated on both sides of a temporary substrate (e.g., a core). The asymmetric build-up layer count can reduce the overall layer count in the fabrication of the semiconductor package and can therefore contribute to fabrication cost reduction. In further embodiments, the semiconductor package (e.g., a millimeter (mm)-wave antenna packages) can further comprise dummification elements disposed near one or more antenna layers. Further, the dummification elements disposed near one or more antenna layers can reduce image current and thereby increasing the antenna gain and efficiency.
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公开(公告)号:US11600594B2
公开(公告)日:2023-03-07
申请号:US17708444
申请日:2022-03-30
Applicant: Intel Corporation
Inventor: Shawna M. Liff , Adel A. Elsherbini , Johanna M. Swan , Arun Chandrasekhar
Abstract: Microelectronic assemblies, and related devices and methods, are disclosed herein. For example, in some embodiments, a microelectronic assembly may include a package substrate having a first surface and an opposing second surface, and a die secured to the package substrate, wherein the die has a first surface and an opposing second surface, the die has first conductive contacts at the first surface and second conductive contacts at the second surface, and the first conductive contacts are coupled to conductive pathways in the package substrate by first non-solder interconnects.
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公开(公告)号:US11569428B2
公开(公告)日:2023-01-31
申请号:US16347097
申请日:2016-12-27
Applicant: Intel Corporation
Inventor: Jeanette M. Roberts , Adel A. Elsherbini , Shawna Liff , Johanna M. Swan , Roman Caudillo , Zachary R. Yoscovits , Nicole K. Thomas , Ravi Pillarisetty , Hubert C. George , James S. Clarke
IPC: H01L27/32 , H01L39/04 , G06N10/00 , H01L39/02 , H01L39/22 , H01L39/24 , H01L25/00 , H01L23/48 , H01L23/00 , H01L27/18 , B82Y10/00 , H01L23/538 , H01L29/66
Abstract: One superconducting qubit device package disclosed herein includes a die having a first face and an opposing second face, and a package substrate having a first face and an opposing second face. The die includes a quantum device including a plurality of superconducting qubits and a plurality of resonators on the first face of the die, and a plurality of conductive pathways coupled between conductive contacts at the first face of the die and associated ones of the plurality of superconducting qubits or of the plurality of resonators. The second face of the package substrate also includes conductive contacts. The device package further includes first level interconnects disposed between the first face of the die and the second face of the package substrate, coupling the conductive contacts at the first face of the die with associated conductive contacts at the second face of the package substrate.
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公开(公告)号:US20220406751A1
公开(公告)日:2022-12-22
申请号:US17354773
申请日:2021-06-22
Applicant: Intel Corporation
Inventor: Adel A. Elsherbini , Shawna M. Liff , Johanna M. Swan , Julien Sebot
IPC: H01L25/065 , H01L23/00 , H01L21/683
Abstract: A microelectronic assembly is provided, comprising: a first integrated circuit (IC) die at a first level, a second IC die at a second level, and a third IC die at a third level, the second level being in between the first level and the third level. A first interface between the first level and the second level is electrically coupled with high-density interconnects of a first pitch and a second interface between the second level and the third level is electrically coupled with interconnects of a second pitch. In some embodiments, at least one of the first IC die, second IC die, and third IC die comprises another microelectronic assembly. In other embodiments, at least one of the first IC die, second IC die, and third IC die comprises a semiconductor die.
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公开(公告)号:US11509069B2
公开(公告)日:2022-11-22
申请号:US16901243
申请日:2020-06-15
Applicant: Intel Corporation
Inventor: Telesphor Kamgaing , Adel A. Elsherbini
Abstract: Embodiments described herein generally relate to phased array antenna systems or packages and techniques of making and using the systems and packages. A phased array antenna package may include a distributed phased array antenna comprising (1) a plurality of antenna sub-arrays, which may each include a plurality of antennas, (2) a plurality of Radio Frequency Dies (RFDs), each of the RFDs located proximate and electrically coupled by a trace of a plurality of traces to a corresponding antenna sub-array of the plurality of antenna sub-arrays, and (3) wherein each trace of the plurality of traces configured to electrically couple an antenna of the plurality of antennas to the RFD located proximate the antenna, wherein each trace of the plurality of traces is configured to transmit millimeter wave (mm-wave) radio signals, and wherein the plurality of traces are each of a substantially uniform length.
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公开(公告)号:US11469206B2
公开(公告)日:2022-10-11
申请号:US16008879
申请日:2018-06-14
Applicant: Intel Corporation
Inventor: Adel A. Elsherbini , Feras Eid , Johanna M. Swan , Shawna M. Lift
IPC: H01L25/065 , H01L25/18 , H01L25/00 , H01L23/00
Abstract: Microelectronic assemblies, related devices and methods, are disclosed herein. In some embodiments, a microelectronic assembly may include a package substrate having a first surface and an opposing second surface; a first die having a first surface and an opposing second surface embedded in a first dielectric layer, where the first surface of the first die is coupled to the second surface of the package substrate by first interconnects; a second die having a first surface and an opposing second surface embedded in a second dielectric layer, where the first surface of the second die is coupled to the second surface of the first die by second interconnects; and a third die having a first surface and an opposing second surface embedded in a third dielectric layer, where the first surface of the third die is coupled to the second surface of the second die by third interconnects.
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公开(公告)号:US20220319996A1
公开(公告)日:2022-10-06
申请号:US17842600
申请日:2022-06-16
Applicant: Intel Corporation
Inventor: Aleksandar Aleksov , Adel A. Elsherbini , Kristof Darmawikarta , Robert A. May , Sri Ranga Sai Boyapati
IPC: H01L23/538 , H01L25/18 , H01L25/065 , H01L21/48 , H01L23/00 , H01L23/31 , H01L25/00 , H01L23/498
Abstract: An apparatus is provided which comprises: a plurality of first conductive contacts having a first pitch spacing on a substrate surface, a plurality of second conductive contacts having a second pitch spacing on the substrate surface, and a plurality of conductive interconnects disposed within the substrate to couple a first grouping of the plurality of second conductive contacts associated with a first die site with a first grouping of the plurality of second conductive contacts associated with a second die site and to couple a second grouping of the plurality of second conductive contacts associated with the first die site with a second grouping of the plurality of second conductive contacts associated with the second die site, wherein the conductive interconnects to couple the first groupings are present in a layer of the substrate above the conductive interconnects to couple the second groupings. Other embodiments are also disclosed and claimed.
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