公开(公告)号：US20140274190A1

公开(公告)日：2014-09-18

申请号：US13801232

申请日：2013-03-13

Applicant: QUALCOMM INCORPORATED

Inventor： Lin Lu ,  Jagadish Nadakuduti ,  Paul Guckian

IPC: H04B17/00

CPC classification number: H04W52/367

Abstract: Efficient techniques for determining compliance of a wireless device with radio-frequency (RF) exposure standards and regulations. In an aspect, two-dimensional surface scans of a device are determined and stored in a memory during a certification phase. Each scan corresponds to a basis surface scan wherein only one transmitter and one antenna of the device are active. During real-time operation, the basis surface scans corresponding to the real-time active transmitters and antennas of the device are retrieved. The retrieved scans are processed according to the real-time operating parameters to determine an estimated RF exposure metric, e.g., a peak specific absorption rate (SAR). The transmit power levels of the device may be adjusted in real time to ensure compliance of the estimated RF exposure metric with applicable standards and regulations.

Abstract translation: 确定无线设备符合射频（RF）暴露标准和法规的有效技术。 在一方面，设备的二维表面扫描在认证阶段被确定并存储在存储器中。 每个扫描对应于基础表面扫描，其中只有一个发射机和一个天线的设备是活动的。 在实时操作期间，检索对应于实时有源发射机和设备天线的基础表面扫描。 根据实时操作参数来处理检索的扫描以确定估计的RF暴露度量，例如峰值比吸收率（SAR）。 可以实时调整设备的发射功率电平，以确保估计的RF辐射度量符合适用的标准和规定。