公开(公告)号：US20140092380A1

公开(公告)日：2014-04-03

申请号：US14037912

申请日：2013-09-26

Applicant: Corning Incorporated

Inventor： Xin Chen ,  Jason Edward Hurley ,  Charles Frederick Laing ,  Anping Liu ,  Jody Paul Markley ,  Eric John Mozdy

IPC: G02B6/028

CPC classification number: G02B6/0288 ,  G01M11/31 ,  G01M11/3109 ,  H04B10/071 ,  H04B10/0731 ,  H04B10/2581

Abstract: A method of measuring the bandwidth of a multi-mode optical fiber using single-ended, on-line and off-line approaches and test configurations. The method includes: transmitting a light signal through the first end of a multi-mode fiber toward the second end of the multi-mode fiber, so that a portion of the light signal is reflected by the second end toward the first end of the multi-mode fiber; and receiving the reflected portion of the light signal at the first end of the multi-mode fiber. The method also includes obtaining magnitude and frequency data related to the reflected portion of the light signal at the first end of the multi-mode fiber; and analyzing the magnitude and the frequency data to determine a bandwidth of the multi-mode optical fiber. The length of the multi-mode fiber may also increase over time during testing.

Abstract translation: 使用单端，在线和离线方法和测试配置测量多模光纤的带宽的方法。 该方法包括：通过多模光纤的第一端朝向多模光纤的第二端发送光信号，使得光信号的一部分被第二端反射到多模光纤的第一端 模式光纤 以及在多模光纤的第一端处接收光信号的反射部分。 该方法还包括：在多模光纤的第一端获得与光信号的反射部分相关的幅度和频率数据; 并分析幅度和频率数据以确定多模光纤的带宽。 在测试期间，多模光纤的长度也可随时间而增加。

公开(公告)号：US20140092377A1

公开(公告)日：2014-04-03

申请号：US14033954

申请日：2013-09-23

Applicant: Corning Incorporated

Inventor： Anping Liu ,  Rostislav Vatchev Roussev ,  Vitor Marino Schneider ,  Alana Marie Whittier

IPC: G01N21/23

CPC classification number: G01N21/23 ,  G01J4/04

Abstract: Systems and methods of for measuring birefringence and stress in a sample made of ion-exchanged glass or a ceramic are disclosed, wherein the method includes digitally capturing TE and TM angular spectra of intensity versus pixel number for the sample. The TE and TM angular spectra are processed to minimize differences between respective regions of the TE and TM angular spectra. The amount of shift in pixels that best overlaps the processed TE and TM spectra is determined. The birefringence B is calculated by multiplying the pixel shift by the index resolution. The stress is calculated by multiplying the birefringence by the stress-optic coefficient.

Abstract translation: 公开了用于测量由离子交换玻璃或陶瓷制成的样品中的双折射和应力的系统和方法，其中所述方法包括数字捕获样品的强度与像素数的TE和TM角谱。 处理TE和TM角谱以最小化TE和TM角谱的各个区域之间的差异。 确定与被处理的TE和TM光谱最佳重叠的像素移动量。 通过将像素移位乘以索引分辨率来计算双折射率B。 通过将双折射乘以应力光学系数来计算应力。