公开(公告)号：US20190157470A1

公开(公告)日：2019-05-23

申请号：US16091409

申请日：2017-04-03

Applicant: trinamiX GmbH

Inventor： Robert SEND ,  Ingmar BRUDER ,  Christoph LUNGENSCHMIED ,  Wilfried HERMES ,  Sebastian VALOUCH

IPC: H01L31/02 ,  G01S17/46 ,  G01S7/481 ,  H01L31/101 ,  H01L31/105 ,  H01L27/146

Abstract: A detector for determining a position of at least one object, in particular for 3D-sensing concepts, is disclosed. The detector comprises a longitudinal optical sensor (110) for determining a longitudinal position of an object by a light beam traveling from the object to the detector and a transversal optical detector (112) which may be designed as an imaging device or a position sensitive detector. The longitudinal sensor (110) has at least two PN structures or PIN structures (138, 140). Each of the PN structures or PIN structures is located between two electrode layers (144), thereby forming photodiodes (146) having a longitudinal sensor region (148) each. Longitudinal sensor signals from the photodiodes (146) are, given the same total power of illumination, are dependent on a beam cross-section of the light beam in the longitudinal sensor regions (148). As an alternative, instead of the transversal optical detector (112) the photodiodes (146) of the longitudinal optical sensor (110) may be adapted to operate as one-dimensional position sensitive detectors each, for determining a transversal x-coordinate and a transversal y-coordinate, respectively.

公开(公告)号：US20180210064A1

公开(公告)日：2018-07-26

申请号：US15744334

申请日：2016-07-14

Applicant: trinamiX GmbH

Inventor： Robert SEND ,  Ingmar BRUDER ,  Sebastian VALOUCH

IPC: G01S5/16 ,  G01S3/784 ,  G01S17/66 ,  G01C3/08

CPC classification number: G01S5/16 ,  G01C3/08 ,  G01C3/32 ,  G01S3/784 ,  G01S7/4816 ,  G01S11/12 ,  G01S17/46 ,  G01S17/66 ,  G06T2207/30204

Abstract: A detector (110) for determining a position of at least one object (118) is proposed. The detector (110) comprises: —at least one optical sensor (112), the optical sensor (112) being configured to detect at least one light spot (156) generated by at least one light beam (150) propagating from the object (118) towards the detector (110), the optical sensor (112) having at least one matrix (152) of pixels (154), each pixel (154) being adapted to generate at least one pixel signal si,j in response to an illumination of the pixel (154) by the light beam (150); —at least one non-linearization device (123) configured to transform the pixel signals si,j of all pixels (154) i, j or of at least one group of pixels (154) into nonlinear pixel signals s′i,j, the nonlinear pixel signals s′i,j each being a nonlinear function of the power of the illumination pi,j of the respective pixel (154); —at least one summing device (125) configured to add up the nonlinearpixel signals s′i,j of all pixels (154) i, j or of the at least one group of pixels (154) and to generate at least one nonlinearsum signal S′=Σijs′ij; and —at least one evaluation device (126), the evaluation device (126) being configured to determine at least one longitudinal coordinate z of the object (118) by evaluating the nonlinear sum signal S′.

公开(公告)号：US20180136319A1

公开(公告)日：2018-05-17

申请号：US15567885

申请日：2016-04-18

Applicant: trinamiX GmbH

Inventor： Robert SEND ,  Ingmar BRUDER ,  Sebastian VALOUCH

IPC: G01S7/481 ,  G01S17/66 ,  G01S17/46

CPC classification number: G01S7/4816 ,  G01C3/32 ,  G01S17/46 ,  G01S17/66

Abstract: A detector for an optical detection of an object, including: a longitudinal optical sensor having a sensor region and designed to generate a longitudinal sensor signal in a manner dependent on an illumination of the sensor region by a light beam, where the longitudinal sensor signal, given the same total power of the illumination, exhibits a dependency on a beam cross-section of the light beam in the sensor region, and is generated by a semiconducting material contained in the sensor region, where a high-resistive material is present at a part of a surface of the semiconducting material, where the high-resistive material exhibits an electrical resistance which equals or exceeds the electrical resistance of the semiconducting material; and an evaluation device, where the evaluation device is designed to generate an item of information on a longitudinal position of the object by evaluating the longitudinal sensor signal of the longitudinal optical sensor.