公开(公告)号：US5074666A

公开(公告)日：1991-12-24

申请号：US475391

申请日：1990-02-05

Applicant: Thomas H. Barnes ,  Kiyofumi Matsuda ,  Naotake Ooyama

Inventor： Thomas H. Barnes ,  Kiyofumi Matsuda ,  Naotake Ooyama

IPC: G01J9/02 ,  G01N21/45

CPC classification number: G01N21/45 ,  G01J2009/0219

Abstract: A high stability interferometer is capable of continuous measurement of small changes in the refractive index of a sample. The interferometer has a diffraction grating placed to be movable sideways or radially, and diffract laser light into beams which include +1, -1 and zero order beams. The diffraction grating is in the input plane of a Fourier Transform lens. The beams are brought to a focus in the output plane of the lens and are reflected back towards the lens by a mirror placed in the transform plane of the lens. The sample whose refractive index is to be measured is placed in the path of the +1 or -1 order beam, between the diffraction grating and the mirror.

Abstract translation: 高稳定性干涉仪能够连续测量样品的折射率的小变化。 该干涉仪具有放置成侧向或径向移动的衍射光栅，并将激光衍射成包括+1，-1和零级光束的光束。 衍射光栅位于傅里叶变换透镜的输入平面内。 光束在透镜的输出平面中被聚焦，并且通过放置在透镜的变换平面中的反射镜朝向透镜反射回。 折射率要被测量的样品放置在衍射光栅和反射镜之间的+1或-1级光束的路径中。