公开(公告)号：US20190108262A1

公开(公告)日：2019-04-11

申请号：US16028886

申请日：2018-07-06

Applicant: Palantir Technologies Inc.

Inventor： Myles Scolnick ,  Jack Grossman ,  Jim Inoue

IPC: G06F17/30

Abstract: This disclosure relates to a system and method for data analysis. According to a first aspect, there is described a method, the method being performed using one or more processors, comprising: receiving one or more user inputs indicative of one or more relationships between data in a plurality of datasets; determining, based on the one or more user inputs, at least one object view for visualising the data in the plurality of datasets; generating, based on the one or more user inputs, metadata comprising: an object graph indicative of the one or more relationships between two or more of the plurality of datasets; and information identifying the at least one object view; and in response to a query relating to the plurality of datasets, using the metadata to determine how response data responding to the query should be provided.

公开(公告)号：US10249033B1

公开(公告)日：2019-04-02

申请号：US15448155

申请日：2017-03-02

Applicant: Palantir Technologies Inc.

Inventor： Alexander Taheri ,  Alexandru Antihi ,  Arion Sprague ,  Benjamin Grabham ,  Benjamin Lee ,  Gregoire Omont ,  Jim Inoue ,  Michael Yang ,  Myles Scolnick ,  Pierre Lucotte ,  Ryan Rowe ,  Tarik Benabdallah ,  Thomas Powell

IPC: G06F3/0482 ,  G06T7/00

Abstract: User interfaces for managing defects are provided. A defect selection interface may include a set of defect items for selection by a user. The defect selection interface may include one or more first visuals indicating similarity of the set of defect items to other defect items. An issue selection interface may include a set of issue items for selection by the user. Individual issue items may include one or more defect items added to the individual issue items. A defect comparison interface may include a comparison of a defect item to an issue item. The defect comparison interface may include one or more second visuals indicating similarity of the defect item to the issue item. Based on the user's selection, the defect item may be added to the issue item.