公开(公告)号：US11002755B2

公开(公告)日：2021-05-11

申请号：US16663866

申请日：2019-10-25

Applicant: Samsung Electronics Co., Ltd.

Inventor： Taekeun Kim ,  Kihoon Kang ,  Shinyoung Na ,  Kihun Eom ,  Jeongmin Park

IPC: G01P15/08 ,  G06F3/14 ,  G06F3/041

Abstract: A method for indicating impact of external shocks on an electronic device and the electronic device thereof are provided. An operating method of the electronic device includes monitoring shock related information due to an external force, calculating a shock amount and a shock position based on the shock related information, and calculating a shock state of a component in the electronic device based on the shock amount and the shock position.