公开(公告)号：US10971560B2

公开(公告)日：2021-04-06

申请号：US16404021

申请日：2019-05-06

Applicant: SAMSUNG DISPLAY CO., LTD.

Inventor： Hyo Jung Kim ,  June Hwan Kim ,  Jong Woo Park ,  Dae Guen Choi ,  Jae Sik Son ,  Young Tae Choi

IPC: H01L27/32 ,  H05K1/18 ,  G09G3/00

Abstract: Disclosed herein are a display device, an apparatus for testing a display device, and a method for testing a display device. A display device includes a first substrate having a display area and a non-display area defined thereon, the non-display area being on an outer side of the display area. The non-display area may include a plurality of test pads and a first dummy thin-film transistor electrically connected to the test pads. The first dummy thin-film transistor includes a dummy gate electrode, and a dummy source electrode and a dummy drain electrode insulated from the gate electrode and spaced apart from each other. A bending area is defined on the first substrate that at least partially traverses the display area and the non-display area, the bending area overlaps the first dummy thin-film transistor.

公开(公告)号：US10804329B2

公开(公告)日：2020-10-13

申请号：US16287389

申请日：2019-02-27

Applicant: Samsung Display Co., Ltd.

Inventor： June Hwan Kim ,  Tae Young Kim ,  Hyo Jung Kim

IPC: G09G3/3225 ,  H01L27/32

Abstract: A display device may include a first pixel including a first transistor, and a first light emitting element on and electrically connected to the first transistor, a second pixel adjacent the first pixel, the second pixel including a second transistor, and a second light emitting element on and electrically connected to the second transistor, and a reflective member at a layer that is above the first pixel and the second pixel, the reflective member being configured to reflect a light emitted from the second light emitting element to the first transistor.