公开(公告)号：US11500021B2

公开(公告)日：2022-11-15

申请号：US17096583

申请日：2020-11-12

Applicant: STMicroelectronics S.r.l.

Inventor： David Vincenzoni

IPC: G01R31/319 ,  H03M1/10

Abstract: A method can be used to test an electronic circuit. The method includes applying a test stimulus signal to the input node, collecting a sequence of N-bit digital test data at the output port. The N-bit digital test data is determined by the test stimulus signal applied to the input node. The method also includes applying N-bit to R-bit lossless compression to the N-bit digital test data to obtain R-bit compressed test data (R is less than N) and making the R-bit compressed test data available in parallel format over R output pins of the circuit.