公开(公告)号：US20140177801A1

公开(公告)日：2014-06-26

申请号：US13725480

申请日：2012-12-21

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Susanne Madeline Lee ,  Sudeep Mandal

IPC: G01N23/207

CPC classification number: G01N23/207 ,  G21K1/06 ,  G21K2207/005 ,  H01J35/08 ,  H01J35/12 ,  H01J35/14 ,  H01J2235/086 ,  H01J2235/186

Abstract: Embodiments of the disclosure relate to X-ray imaging systems. In one embodiment, the X-ray imaging system features a target configured to receive a focused electron beam from an electron emitter and emit a line source X-ray beam as a result of receiving the focused electron beam; and a monochromator crystal configured to receive the line source X-ray beam from the target and diffract only a portion of the X-rays, wherein the portion of X-rays satisfies the Bragg diffraction condition for the monochromator crystal, and wherein the monochromator crystal is oriented relative to the target such that the portion of the X-rays from the target that satisfy the Bragg condition illuminate an entire length of a surface of the monochromator crystal.

Abstract translation: 本公开的实施例涉及X射线成像系统。 在一个实施例中，X射线成像系统具有被配置为从电子发射器接收聚焦的电子束并且作为接收聚焦的电子束而发射线源X射线束的靶; 以及单色器晶体，被配置为从所述目标接收所述线源X射线束，并且仅衍射所述X射线的一部分，其中所述X射线部分满足所述单色器晶体的布拉格衍射条件，并且其中所述单色器晶体 相对于目标取向，使得来自目标的满足布拉格条件的X射线的部分照亮单色器晶体的表面的整个长度。