公开(公告)号：US20140369473A1

公开(公告)日：2014-12-18

申请号：US14352774

申请日：2012-10-19

Applicant: Commissariat A L'Energie Atomique Et Aux Energies Alternatives

Inventor： Caroline Paulus ,  Joachim Tabary

IPC: G01N23/20

CPC classification number: G01N23/20091 ,  G01N23/20066 ,  G01N23/203 ,  G01N2223/063 ,  G01N2223/601

Abstract: The invention relates to a device for identifying a material of an object having: a source of X photons and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after diffusion in a volume of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming an angle of diffusion (θ); a configuration for adjusting the position between the source, the detector and the object in order for the volume to be at different depths with a constant angle, a means for processing the two magnitudes in two positions and the energy in on position and for calculating an attenuation factor (μmaterial (E0, E1, ε)), a configuration for estimating the density (p) of the material.

Abstract translation: 本发明涉及一种用于识别物体的材料的装置，该装置具有：X光子源和光谱检测器，源用入射光束照射物体，检测器测量扩散后的入射光束的后向散射光束的大小 在材料的体积和背散射光束的X光子的能量中，入射和后向散射光束形成扩散角（“θ”）; 用于调节源，检测器和物体之间的位置以使体积以恒定角度处于不同深度的构造，用于处理两个位置中的两个量值并且在位置上的能量并用于计算一个 衰减因子（μm物质（E0，E1，＆egr））），用于估计材料的密度（p）的配置。