公开(公告)号：US11704299B1

公开(公告)日：2023-07-18

申请号：US17205373

申请日：2021-03-18

Applicant: Amazon Technologies, Inc.

Inventor： Tanya Bansal ,  Vidhi Kastuar ,  Saurabh Gupta ,  Alex Tang ,  Lakshmi Naarayanan Ramakrishnan ,  Stefano Stefani ,  Xingyuan Wang ,  Mukesh Karki

IPC: G06F7/00 ,  G06F16/22 ,  G06F21/60 ,  G06F16/21 ,  G06F16/25 ,  G06N20/00 ,  G06F18/214

CPC classification number: G06F16/2291 ,  G06F16/219 ,  G06F16/252 ,  G06F18/214 ,  G06F21/602 ,  G06N20/00

Abstract: Techniques and technologies for providing a fully managed datastore for clients to securely store, discover, retrieve, remove, and share curated data, or features, to develop machine learning (ML) models in an efficient manner. The feature store service may provide clients with the ability to create and store feature groups that include features and associated metadata providing clients with a quick understanding of features so that they may determine which features are suitable for training ML models and/or use with ML models. The feature store service may provide first a data store configured to store the most recent values associated with a feature group, such that client can access the features and utilize ML models to make real-time predictions with low latency and high throughput, and a second datastore configured to store historical values associated with a feature group, such that a client can utilize the features to train ML models.

公开(公告)号：US20210097433A1

公开(公告)日：2021-04-01

申请号：US16588952

申请日：2019-09-30

Applicant: Amazon Technologies, Inc.

Inventor： Andrea Olgiati ,  Maximiliano Maccanti ,  Arun Babu Nagarajan ,  Lakshmi Naarayanan Ramakrishnan ,  Urvashi Chowdhary ,  Gowda Dayananda Anjaneyapura Range ,  Zohar Karnin ,  Laurence Louis Eric Rouesnel ,  Stefano Stefani ,  Vladimir Zhukov

IPC: G06N20/00 ,  G06F11/07

Abstract: Methods, systems, and computer-readable media for automated problem detection for machine learning models are disclosed. A machine learning analysis system receives data associated with use of a machine learning model. The data was collected by a machine learning inference system and comprises input to the model or a plurality of inferences representing output of the machine learning model. The machine learning analysis system performs analysis of the data associated with the use of the machine learning model. The machine learning analysis system detects one or more problems associated with the use of the machine learning model based at least in part on the analysis. The machine learning analysis system initiates one or more remedial actions associated with the one or more problems associated with the use of the machine learning model.

公开(公告)号：US20210097431A1

公开(公告)日：2021-04-01

申请号：US16588913

申请日：2019-09-30

Applicant: Amazon Technologies, Inc.

Inventor： Andrea Olgiati ,  Lakshmi Naarayanan Ramakrishnan ,  Jeffrey John Geevarghese ,  Denis Davydenko ,  Vikas Kumar ,  Rahul Raghavendra Huilgol ,  Amol Ashok Lele ,  Stefano Stefani ,  Vladimir Zhukov

IPC: G06N20/00 ,  G06N5/04

Abstract: Methods, systems, and computer-readable media for debugging and profiling of machine learning model training are disclosed. A machine learning analysis system receives data associated with training of a machine learning model. The data was collected by a machine learning training cluster. The machine learning analysis system performs analysis of the data associated with the training of the machine learning model. The machine learning analysis system detects one or more conditions associated with the training of the machine learning model based at least in part on the analysis. The machine learning analysis system generates one or more alarms describing the one or more conditions associated with the training of the machine learning model.