公开(公告)号：US20240283549A1

公开(公告)日：2024-08-22

申请号：US18444452

申请日：2024-02-16

Applicant: Tektronix, Inc.

Inventor： Archana I. Akkalkot ,  Alka Kumari ,  Sakchi Sinha

IPC: H04B17/20 ,  H04B17/00 ,  H04B17/309

CPC classification number: H04B17/201 ,  H04B17/0085 ,  H04B17/309

Abstract: A test and measurement system includes a proximity coupling device to transmit a modulated carrier signal and a proximity integrated circuit card to load modulate the transmitted modulated carrier signal and generate a modulated subcarrier signal on the wireless carrier signal. A test and measurement instrument acquires the modulated carrier signal and includes a phase-aligned subcarrier demodulator to demodulate the carrier signal including the modulated subcarrier signal. A demodulator detects commands and responses in the modulated carrier signal, removes the commands, and identifies a correlation index for each response. Each correlation index indicates a phase of the modulated carrier signal of the corresponding response relative to a replica carrier signal. The demodulator adjusts the phase of the replica carrier signal based on the correlation index for each response and down converts each response using the phase-aligned replica carrier signal. The modulated subcarrier signal is low pass filtered to demodulate response.